Development of a multi-functional multi-probe atomic force microscope system with optical beam deflection method

2021 ◽  
Vol 92 (12) ◽  
pp. 123705
Author(s):  
Peng Li ◽  
Yongjian Shao ◽  
Ke Xu ◽  
Xiaohui Qiu
Keyword(s):  
Atomic Force Microscope ◽  
Optical Beam ◽  
Beam Deflection ◽  
Atomic Force

scholarly journals Оптимизация измерений вектора силы взаимодействия в атомно-силовой микроскопии

2021 ◽  
Vol 91 (6) ◽  
pp. 1043
Author(s):  
А.В. Анкудинов ◽  
А.М. Минарский
Keyword(s):  
Atomic Force Microscope ◽  
Satisfactory Agreement ◽  
Torsion Angle ◽  
Displacement Vector ◽  
Interaction Force ◽  
Optical Beam ◽  
Beam Deflection ◽  
Optimal Point ◽  
Atomic Force ◽  
The Ideal

The issue of optimization of measurements of three spatial components of the probe-sample interaction force and the corresponding displacement vector of the "ideal cantilever" is considered. To determine these components in an atomic force microscope with an optical beam deflection scheme, it is necessary to register the bending angles at least at two points on the rectangular cantilever and the torsion angle at any of them. It has been proven analytically that one optimal point is the intersection of the probe axis with the console plane. A method to calculate the position of another optimal point has been developed. An experiment was carried out to map the force and displacement vector, and satisfactory agreement with the theory was obtained.

Optical beam deflection noncontact atomic force microscope optimized with three-dimensional beam adjustment mechanism

2000 ◽  
Vol 71 (1) ◽  
pp. 128-132 ◽  
Author(s):  
Kousuke Yokoyama ◽  
Taketoshi Ochi ◽  
Takayuki Uchihashi ◽  
Makoto Ashino ◽  
Yasuhiro Sugawara ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Three Dimensional ◽  
Optical Beam ◽  
Beam Deflection ◽  
Adjustment Mechanism ◽  
Atomic Force

Development of multi-environment dual-probe atomic force microscopy system using optical beam deflection sensors with vertically incident laser beams

2013 ◽  
Vol 84 (8) ◽  
pp. 083701 ◽  
Author(s):  
Eika Tsunemi ◽  
Kei Kobayashi ◽  
Noriaki Oyabu ◽  
Masaharu Hirose ◽  
Yoshiko Takenaka ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Optical Beam ◽  
Laser Beams ◽  
Beam Deflection ◽  
Incident Laser ◽  
Force Microscopy ◽  
Atomic Force ◽  
Dual Probe

Multi-Probe Atomic Force Microscopy with Optical Beam Deflection Method

2007 ◽  
Vol 46 (8B) ◽  
pp. 5636-5638 ◽  
Author(s):  
Eika Tsunemi ◽  
Nobuo Satoh ◽  
Yuji Miyato ◽  
Kei Kobayashi ◽  
Kazumi Matsushige ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Optical Beam ◽  
Beam Deflection ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals A detailed analysis of the optical beam deflection technique for use in atomic force microscopy

1992 ◽  
Vol 72 (1) ◽  
pp. 6-12 ◽  
Author(s):  
Constant A. J. Putman ◽  
Bart G. De Grooth ◽  
Niek F. Van Hulst ◽  
Jan Greve
Keyword(s):  
Atomic Force Microscopy ◽  
Detailed Analysis ◽  
Optical Beam ◽  
Beam Deflection ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Design of a ‘‘beetle‐type’’ atomic force microscope using the beam deflection technique

1996 ◽  
Vol 67 (5) ◽  
pp. 1925-1929 ◽  
Author(s):  
B. Gasser ◽  
A. Menck ◽  
H. Brune ◽  
K. Kern
Keyword(s):  
Atomic Force Microscope ◽  
Beam Deflection ◽  
Atomic Force
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