Telescopic small-signal amplifier with a Brillouin mirror

1979 ◽  
Vol 9 (10) ◽  
pp. 1336-1337 ◽  
Author(s):  
A A Kalinina ◽  
V V Lyubimov ◽  
L V Nosova ◽  
I B Orlova
Author(s):  
Mizuki Motoyoshi ◽  
Kyoya Takano ◽  
Kosuke Katayama ◽  
Minoru Fujishima

1963 ◽  
Author(s):  
D. NEUF ◽  
P. LOMBARDO

2019 ◽  
Vol 49 (10) ◽  
pp. 919-924 ◽  
Author(s):  
S S Aleshkina ◽  
D S Lipatov ◽  
T A Kochergina ◽  
V V Velmiskin ◽  
V L Temyanko ◽  
...  

2012 ◽  
Vol 433-440 ◽  
pp. 2774-2779
Author(s):  
Zeng Min Yuan ◽  
Xu Jin Yuan

Signal source output resistance and negative feedback resistance all contribute to restrain transistor non-linearity and improve amplifier linearity. Amplifier sine output voltage and transistor emitting junction non-sine voltage coexist. Transistor emitting junction non-sine voltage is a by-product and doesn’t affect amplifier function. It was proved by experiment and in theory that the input signal magnitude in the basic common-emitter amplifier is not limited with small signal extent condition Ubem≤10mV, and output range is not limited with Ubem≤10mV. It was proved that small signal amplifier conception does not accord with the facts and might be not suitable.


A new PSpice Model of BJT and JFET is proposed and its hybrid combination is used in Sziklai pair topology to design small signal amplifier. The proposed amplifier with maximum voltage gain 30.41, maximum current gain 43.05 and THD 2.44% is capable of amplifying low magnitude signals in a frequency range distributed from 3.035Hz to 93.808Hz. This feature explores the possibility to use proposed amplifier circuit in EEG, seismographs and underwater communication circuits. Three different circuit/device combinations are also exposed during the exploration of proposed amplifier and therefore mentioned with primary details. Qualitative behaviour, e.g. temperature dependency, noise behaviour, effect of the variation of biasing resistances and capacitors, small signal AC analysis etc., of the proposed circuit, is also studied to observe its performance under different environment.


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