Two-dimensional image edge enhancement by two-phonon Bragg diffraction

2011 ◽  
Vol 41 (12) ◽  
pp. 1109-1113 ◽  
Author(s):  
V M Kotov ◽  
G N Shkerdin ◽  
A N Bulyuk
2010 ◽  
Vol 40 (4) ◽  
pp. 368-370 ◽  
Author(s):  
V M Kotov ◽  
S V Averin ◽  
G N Shkerdin ◽  
A I Voronko

Micromachines ◽  
2021 ◽  
Vol 12 (8) ◽  
pp. 929
Author(s):  
Xudong Yang ◽  
Zexiao Li ◽  
Linlin Zhu ◽  
Yuchu Dong ◽  
Lei Liu ◽  
...  

Taper-cutting experiments are important means of exploring the nano-cutting mechanisms of hard and brittle materials. Under current cutting conditions, the brittle-ductile transition depth (BDTD) of a material can be obtained through a taper-cutting experiment. However, taper-cutting experiments mostly rely on ultra-precision machining tools, which have a low efficiency and high cost, and it is thus difficult to realize in situ measurements. For taper-cut surfaces, three-dimensional microscopy and two-dimensional image calculation methods are generally used to obtain the BDTDs of materials, which have a great degree of subjectivity, leading to low accuracy. In this paper, an integrated system-processing platform is designed and established in order to realize the processing, measurement, and evaluation of taper-cutting experiments on hard and brittle materials. A spectral confocal sensor is introduced to assist in the assembly and adjustment of the workpiece. This system can directly perform taper-cutting experiments rather than using ultra-precision machining tools, and a small white light interference sensor is integrated for in situ measurement of the three-dimensional topography of the cutting surface. A method for the calculation of BDTD is proposed in order to accurately obtain the BDTDs of materials based on three-dimensional data that are supplemented by two-dimensional images. The results show that the cutting effects of the integrated platform on taper cutting have a strong agreement with the effects of ultra-precision machining tools, thus proving the stability and reliability of the integrated platform. The two-dimensional image measurement results show that the proposed measurement method is accurate and feasible. Finally, microstructure arrays were fabricated on the integrated platform as a typical case of a high-precision application.


2013 ◽  
Vol 21 (3) ◽  
pp. 552-562
Author(s):  
Hsuan-Chun Liao ◽  
Mochamad Asri ◽  
Tsuyoshi Isshiki ◽  
Dongju Li ◽  
Hiroaki Kunieda

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