Composition and Structure of Liquid Polysulfide Oligomers Based on Sulfur, Styrene and Methacrylic Acid

1999 ◽  
Vol 32 (2) ◽  
pp. 321-331 ◽  
Author(s):  
D. Todorova ◽  
St. Todorov
2019 ◽  
Vol 2019 (1) ◽  
pp. 29-39
Author(s):  
A.E. Marchenko ◽  
◽  
V.V. Trachevsky ◽  
N.V. Skorina ◽  
◽  
...  

2020 ◽  
pp. 026248932093425
Author(s):  
Oleg A Kazantsev ◽  
Konstantin V Shirshin ◽  
Pavel V Kornienko ◽  
Alexey P Sivokhin

The review summarises the trends in the development of research on the synthesis of polymethacrylimides (PMIs) and polyacrylimides by the method of intramolecular thermal imidisation of (meth)acrylic polymers. Along with the widely used industry variant of PMI foam of the ‘Rohacell’ series based on bulk copolymers of methacrylonitrile and methacrylic acid, intensive research on alternative variants began after 2005. This review describes the main and side reactions when using polymer precursors of different structures as well as the effect of precursor composition and structure on the properties of the resulting poly(meth)acrylimides. It has been shown that the achievements of the last 15 years provide a basis for reducing the cost of poly(meth)acrylimides which will significantly expand the areas and scale of their application.


1968 ◽  
Vol 40 (3) ◽  
pp. 629-632 ◽  
Author(s):  
Ferencz. Denes ◽  
Nicolae. Asandei ◽  
Cristofor. Simionescu

2019 ◽  
Vol 2019 (1) ◽  
pp. 15-24
Author(s):  
A.E. Marchenko ◽  
◽  
V.V. Trachevsky ◽  
N.V. Skorina ◽  
◽  
...  

1984 ◽  
Vol 114 ◽  
pp. 421-424 ◽  
Author(s):  
D. Todorova ◽  
Iv. Mladenov ◽  
M. Markov ◽  
St. Todorov

Author(s):  
A. F. Marshall ◽  
J. W. Steeds ◽  
D. Bouchet ◽  
S. L. Shinde ◽  
R. G. Walmsley

Convergent beam electron diffraction is a powerful technique for determining the crystal structure of a material in TEM. In this paper we have applied it to the study of the intermetallic phases in the Cu-rich end of the Cu-Zr system. These phases are highly ordered. Their composition and structure has been previously studied by microprobe and x-ray diffraction with sometimes conflicting results.The crystalline phases were obtained by annealing amorphous sputter-deposited Cu-Zr. Specimens were thinned for TEM by ion milling and observed in a Philips EM 400. Due to the large unit cells involved, a small convergence angle of diffraction was used; however, the three-dimensional lattice and symmetry information of convergent beam microdiffraction patterns is still present. The results are as follows:1) 21 at% Zr in Cu: annealed at 500°C for 5 hours. An intermetallic phase, Cu3.6Zr (21.7% Zr), space group P6/m has been proposed near this composition (2). The major phase of our annealed material was hexagonal with a point group determined as 6/m.


Author(s):  
J.K. Weiss ◽  
M. Gajdardziska-Josifovska ◽  
M. R. McCartney ◽  
David J. Smith

Interfacial structure is a controlling parameter in the behavior of many materials. Electron microscopy methods are widely used for characterizing such features as interface abruptness and chemical segregation at interfaces. The problem for high resolution microscopy is to establish optimum imaging conditions for extracting this information. We have found that off-axis electron holography can provide useful information for the study of interfaces that is not easily obtained by other techniques.Electron holography permits the recovery of both the amplitude and the phase of the image wave. Recent studies have applied the information obtained from electron holograms to characterizing magnetic and electric fields in materials and also to atomic-scale resolution enhancement. The phase of an electron wave passing through a specimen is shifted by an amount which is proportional to the product of the specimen thickness and the projected electrostatic potential (ignoring magnetic fields and diffraction effects). If atomic-scale variations are ignored, the potential in the specimen is described by the mean inner potential, a bulk property sensitive to both composition and structure. For the study of interfaces, the specimen thickness is assumed to be approximately constant across the interface, so that the phase of the image wave will give a picture of mean inner potential across the interface.


1985 ◽  
Vol 46 (C9) ◽  
pp. C9-107-C9-111
Author(s):  
J. F. Jal ◽  
J. Dupuy ◽  
A. Sadoc
Keyword(s):  

2019 ◽  
Vol 326 (3) ◽  
pp. 76-78
Author(s):  
V.L. Nalobova ◽  
◽  
N.S. Opimah ◽  
M.V. Nalobova ◽  
I.V. Haponenka ◽  
...  

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