Partially Accelerated Life Tests for the Weibull Distribution Under Multiply Censored Data

2012 ◽  
Vol 41 (9) ◽  
pp. 1667-1678 ◽  
Author(s):  
F. K. Wang ◽  
Y. F. Cheng ◽  
W. L. Lu
Author(s):  
M. Kumar ◽  
P. N. Bajeel ◽  
P. C. Ramyamol

In this paper, constant–stress partially accelerated life tests (PALT) are considered for a product with the assumption that the lifetime of the product follows Weibull distribution with known shape parameter and unknown scale parameter. Based on data obtained using Type-II censoring, the maximum likelihood estimates (MLEs) of the Weibull parameters and acceleration factor are obtained assuming linear and Arrhenius relationships with the lifetime characteristics and stress. Exact distributions of the MLEs of the parameters of Weibull distribution are also obtained. Optimal acceptance sampling plans are developed using both linear and Arrhenius relationships. Some numerical results are also presented to illustrate the resulted test plans.


2015 ◽  
Vol 2015 ◽  
pp. 1-13 ◽  
Author(s):  
M. M. Mohie EL-Din ◽  
S. E. Abu-Youssef ◽  
Nahed S. A. Ali ◽  
A. M. Abd El-Raheem

Based on progressive censoring, step-stress partially accelerated life tests are considered when the lifetime of a product follows power generalized Weibull distribution. The maximum likelihood estimates (MLEs) and Bayes estimates (BEs) are obtained for the distribution parameters and the acceleration factor. In addition, the approximate and bootstrap confidence intervals (CIs) of the estimators are presented. Furthermore, the optimal stress change time for the step-stress partially accelerated life test is determined by minimizing the asymptotic variance of MLEs of the model parameters and the acceleration factor. Simulation results are carried out to study the precision of the MLEs and BEs for the parameters involved.


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