Surface Characterization of Materials at Ambient Conditions by Scanning Tunneling Microscopy (STM) and Atomic Force Microscopy (AFM)

Sergei N. Magonov

doi:10.1080/05704929308021499

Surface Characterization of Materials at Ambient Conditions by Scanning Tunneling Microscopy (STM) and Atomic Force Microscopy (AFM)

Applied Spectroscopy Reviews ◽

10.1080/05704929308021499 ◽

1993 ◽

Vol 28 (1-2) ◽

pp. 1-121 ◽

Cited By ~ 38

Author(s):

Sergei N. Magonov

Keyword(s):

Atomic Force Microscopy ◽

Scanning Tunneling Microscopy ◽

Surface Characterization ◽

Scanning Tunneling ◽

Ambient Conditions ◽

Tunneling Microscopy ◽

Force Microscopy ◽

Atomic Force ◽

Characterization Of Materials

Surface Characterization of Plasma Etched DLC Films by Scanning Tunneling Microscopy and Atomic Force Microscopy

Solid State Phenomena ◽

10.4028/www.scientific.net/ssp.78-79.183 ◽

2001 ◽

Vol 78-79 ◽

pp. 183-190 ◽

Cited By ~ 1

Author(s):

E.R. Hwang ◽

W. Choi ◽

Y. Iseri ◽

H. Tomokage

Keyword(s):

Atomic Force Microscopy ◽

Scanning Tunneling Microscopy ◽

Surface Characterization ◽

Scanning Tunneling ◽

Tunneling Microscopy ◽

Force Microscopy ◽

Atomic Force

Scanning tunneling microscopy and atomic force microscopy characterization of polystyrene spin-coated onto silicon surfaces

Langmuir ◽

10.1021/la00039a030 ◽

1992 ◽

Vol 8 (3) ◽

pp. 920-926 ◽

Cited By ~ 63

Author(s):

T. G. Stange ◽

Roy Mathew ◽

D. Fennell Evans ◽

W. A. Hendrickson

Keyword(s):

Atomic Force Microscopy ◽

Scanning Tunneling Microscopy ◽

Silicon Surfaces ◽

Scanning Tunneling ◽

Tunneling Microscopy ◽

Force Microscopy ◽

Atomic Force ◽

Microscopy Characterization ◽

Atomic Force Microscopy Characterization

Atomic force microscopy and scanning tunneling microscopy-spectroscopy characterization of ZnO nanobelts

Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena ◽

10.1116/1.2838048 ◽

2008 ◽

Vol 26 (4) ◽

pp. 1606 ◽

Cited By ~ 4

Author(s):

T. G. G. Maffeïs ◽

M. W. Penny ◽

M. R. Brown ◽

K. W. Liew ◽

D. Fu ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Scanning Tunneling Microscopy ◽

Scanning Tunneling ◽

Tunneling Microscopy ◽

Force Microscopy ◽

Atomic Force

Scanning tunneling microscopy and atomic force microscopy in the characterization of activated graphite electrodes

Analytical Chemistry ◽

10.1021/ac00010a023 ◽

1991 ◽

Vol 63 (10) ◽

pp. 1047-1049 ◽

Cited By ~ 29

Author(s):

Michael S. Freund ◽

Anna. Brajter-Toth ◽

Therese M. Cotton ◽

Eric R. Henderson

Keyword(s):

Atomic Force Microscopy ◽

Scanning Tunneling Microscopy ◽

Scanning Tunneling ◽

Tunneling Microscopy ◽

Graphite Electrodes ◽

Force Microscopy ◽

Atomic Force

Characterization of scanning tunneling microscopy and atomic force microscopy-based techniques for nanolithography on hydrogen-passivated silicon

Journal of Applied Physics ◽

10.1063/1.368334 ◽

1998 ◽

Vol 84 (4) ◽

pp. 1776-1781 ◽

Cited By ~ 92

Author(s):

P. A. Fontaine ◽

E. Dubois ◽

D. Stiévenard

Keyword(s):

Atomic Force Microscopy ◽

Scanning Tunneling Microscopy ◽

Scanning Tunneling ◽

Tunneling Microscopy ◽

Force Microscopy ◽

Atomic Force ◽

Passivated Silicon

Characterization of nanoscale conducting filament in high-k oxides by scanning tunneling microscopy and conductive atomic force microscopy

10.32657/10356/72747 ◽

2017 ◽

Author(s):

◽

Yu Zhou

Keyword(s):

Atomic Force Microscopy ◽

Scanning Tunneling Microscopy ◽

Scanning Tunneling ◽

Tunneling Microscopy ◽

Conductive Atomic Force Microscopy ◽

Conducting Filament ◽

Force Microscopy ◽

Atomic Force ◽

High K

Local Characterization of Ultrathin ZnO Layers on Ag(111) by Scanning Tunneling Microscopy and Atomic Force Microscopy

The Journal of Physical Chemistry C ◽

10.1021/jp509013p ◽

2014 ◽

Vol 118 (47) ◽

pp. 27428-27435 ◽

Cited By ~ 18

Author(s):

Akitoshi Shiotari ◽

Bo Hong Liu ◽

Simon Jaekel ◽

Leonhard Grill ◽

Shamil Shaikhutdinov ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Scanning Tunneling Microscopy ◽

Scanning Tunneling ◽

Tunneling Microscopy ◽

Force Microscopy ◽

Atomic Force ◽

Local Characterization

The characterization of organic monolayers at gold surfaces using scanning tunneling microscopy and atomic force microscopy: Correlation with macrostructural properties

10.31274/rtd-180813-12605 ◽

1992 ◽

Author(s):

Carla Ann Alves

Keyword(s):

Atomic Force Microscopy ◽

Scanning Tunneling Microscopy ◽

Scanning Tunneling ◽

Tunneling Microscopy ◽

Organic Monolayers ◽

Gold Surfaces ◽

Force Microscopy ◽

Atomic Force

Combined atomic force microscopy and scanning tunneling microscopy imaging of cross-sectioned GaN light-emitting diodes

Scanning ◽

10.1002/sca.4950250109 ◽

2006 ◽

Vol 25 (1) ◽

pp. 45-51 ◽

Cited By ~ 1

Author(s):

J. W. Bender ◽

M. E. Salmon ◽

P. E. Russell

Keyword(s):

Atomic Force Microscopy ◽

Scanning Tunneling Microscopy ◽

Light Emitting Diodes ◽

Scanning Tunneling ◽

Tunneling Microscopy ◽

Microscopy Imaging ◽

Light Emitting ◽

Force Microscopy ◽

Atomic Force

Scanning Tunneling Microscopy and Atomic Force Microscopy Studies of Conducting Polymer Films

Atomic Force Microscopy/Scanning Tunneling Microscopy ◽

10.1007/978-1-4757-9322-2_24 ◽

1994 ◽

pp. 229-236

Author(s):

Timothy L. Porter

Keyword(s):

Atomic Force Microscopy ◽

Scanning Tunneling Microscopy ◽

Conducting Polymer ◽

Polymer Films ◽

Scanning Tunneling ◽

Tunneling Microscopy ◽

Force Microscopy ◽

Atomic Force ◽

Conducting Polymer Films