Maximum longitudinal electric-field component of the evanescent wave excited by incidentp-polarized light in total internal reflection at a dielectric–dielectric interface

2012 ◽  
Vol 59 (6) ◽  
pp. 544-546
Author(s):  
R.M.A. Azzam
Keyword(s):  
Electric Field ◽  
Evanescent Wave ◽  
Total Internal Reflection ◽  
Field Component ◽  
Polarized Light ◽  
Electric Field Component ◽  
Internal Reflection ◽  
Longitudinal Electric Field ◽  
Dielectric Interface

scholarly journals Shaping the longitudinal electric field component of light

2019 ◽  
Author(s):  
Fabian Maucher ◽  
Stefan Skupin ◽  
Simon A. Gardiner ◽  
Ifan G. Hughes
Keyword(s):  
Electric Field ◽  
Field Component ◽  
Electric Field Component ◽  
Longitudinal Electric Field

scholarly journals NMR-based metabolomics with enhanced sensitivity

RSC Advances ◽  
2021 ◽  
Vol 11 (15) ◽  
pp. 8694-8700
Author(s):  
Kousik Chandra ◽  
Samah Al-Harthi ◽  
Sujeesh Sukumaran ◽  
Fatimah Almulhim ◽  
Abdul-Hamid Emwas ◽  
...  
Keyword(s):  
Electric Field ◽  
Field Component ◽  
Electric Field Component ◽  
Spin Noise ◽  
Enhanced Sensitivity ◽  
Shaped Tube

We combined Spin Noise Tuning Optimum (SNTO) and electric field component-optimized shaped tube to boost sensitivity for NMR-based metabolomics.

ON OPTIMUM PUPIL FIELDS WITH MAXIMUM ELECTRIC FIELD COMPONENT IN FOCUS

2010 ◽  
Vol 19 (01) ◽  
pp. 189-201
Author(s):  
H. P. URBACH ◽  
S. F. PEREIRA ◽  
D. J. BROER
Keyword(s):  
Electric Field ◽  
Field Component ◽  
Optical Axis ◽  
Focal Point ◽  
Longitudinal Component ◽  
Electric Field Component ◽  
Incident Power ◽  
Entrance Pupil ◽  
Maximum Electric Field ◽  
High Na Lens

The field in the entrance pupil of a high NA lens can be optimized such that, for given incident power, the electric field component in a given direction in the focal point is maximum. If the field component is chosen parallel to the optical axis, the longitudinal component is maximized and it is found that the optimum longitudinal component is narrower than the Airy spot. We discuss how this can be used to obtain higher resolution in photolithography when a resist is used that is sensitive to only the longitudinal component. We describe a proposition for realizing such resist.

Transmission of Elegant Laguerre-Gaussian beams at a dielectric interface - numerical simulations

2009 ◽  
Vol 57 (2) ◽  
pp. 181-188 ◽  
Author(s):  
W. Szabelak ◽  
W. Nasalski
Keyword(s):  
Numerical Simulations ◽  
Total Internal Reflection ◽  
Polarization Effect ◽  
Internal Reflection ◽  
Gaussian Beams ◽  
Cross Polarization ◽  
Dielectric Interface ◽  
Theoretical Predictions ◽  
Critical Incidence

Transmission of Elegant Laguerre-Gaussian beams at a dielectric interface - numerical simulations Behaviour of Laguerre-Gaussian beams impinged at a dielectric interface under distinct angles is discussed. For different incident angles the beams interact with the interface differently. Two ranges of incident angles, specified by a position of a spectral cone of beam field and related to a cross-polarization effect, are analyzed. Boundary between these two ranges is defined. Cases of critical incidence and total internal reflection are also discussed. Paraxial beams near the lower paraxial limit are considered. Theoretical predictions are confirmed by numerical simulations.

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