Characterization of the retardance of a wave plate to increase the robustness of amplitude-only and phase-only modulations of a liquid crystal display

2005 ◽  
Vol 52 (4) ◽  
pp. 633-650 ◽  
Author(s):  
A. Márquez ◽  
C. Cazorla ◽  
M. J. Yzuel ◽  
J. Campos
Keyword(s):  
Liquid Crystal ◽  
Liquid Crystal Display ◽  
Wave Plate

Microstructural and microspectral characterization of a vertically aligned liquid crystal display panel

2011 ◽  
Vol 36 (4) ◽  
pp. 567 ◽  
Author(s):  
Chien-Chung Tsai ◽  
Yen-Sheng Lin ◽  
Shan-Chuang Pei ◽  
Chia-Kai Chang ◽  
Ting-Hao Chen ◽  
...  
Keyword(s):  
Liquid Crystal ◽  
Liquid Crystal Display ◽  
Liquid Crystal Display Panel ◽  
Vertically Aligned

Optical Characterization of the Twisted Nematic Liquid Crystal Display

2009 ◽  
Vol 1242 ◽  
Author(s):  
Carolina Rickenstorff ◽  
A. S. Ostrovsky
Keyword(s):  
Liquid Crystal ◽  
Interference Pattern ◽  
Nematic Liquid Crystal ◽  
Phase Modulation ◽  
Liquid Crystal Display ◽  
Optical Characterization ◽  
Gray Level ◽  
Twisted Nematic ◽  
Twisted Nematic Liquid Crystal

ABSTRACTA simple optical characterization technique is developed for to find the amplitude and phase modulation modes for the twisted nematic liquid crystal display (TN-LCD). The developed technique is based on intensity and pixel shift measurements of the interference pattern obtained from the TN-LCD sandwiched between two polarizers in a modified Young's experiment. Particularly, specimen LC2002 Holoeye is characterized and its amplitude and phase modulation curves as a function of image's gray level, bright B and contrast C are presented.

scholarly journals Characterization of the Liquid Crystal Display Modulation. Optimization for Some Applications

2002 ◽  
Vol 101 (1) ◽  
pp. 189-200 ◽  
Author(s):  
J. Campos ◽  
A. Márquez ◽  
J. Nicolás ◽  
I. Moreno ◽  
C. Iemmi ◽  
...  
Keyword(s):  
Liquid Crystal ◽  
Liquid Crystal Display

Characterization Of Inorganic Contamination In Liquid Crystal Display Materials Using Total Reflection X-Ray Fluorescence (TXRF)

1994 ◽  
Vol 345 ◽  
Author(s):  
R. S. Hockett ◽  
J. M. Metz
Keyword(s):  
Liquid Crystal ◽  
Liquid Crystal Display ◽  
Total Reflection ◽  
Depth Information ◽  
Inorganic Elements ◽  
X Ray ◽  
Glass Substrates ◽  
Glancing Angle ◽  
Inorganic Contamination

AbstractThis work is a feasibility study for using Total reflection X-Ray Fluorescence (TXRF) to characterize inorganic contamination at the surface of, and in, liquid crystal display materials as a function of their processing. Five samples were taken from process steps called: Cr black mask, Cr pattern, RGB pattern, topcoat, and ITO, all on glass substrates. TXRF, a glancing angle XRF technique, is sensitive to inorganic elements and can be used to detect inorganic contamination at surfaces. In addition, increasing the glancing angle can lead to penetration of thin films, and thereby to some qualitative depth information for the detected elements. Elements detected in this study included: Al, Si, S, Cl, In/Sn, Ca, Ba, Cr, Fe, Cu, Ni and Zn.

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