Quantitative characterization of recyclable resources dismantled from waste liquid crystal display products

2018 ◽  
Vol 20 (4) ◽  
pp. 2054-2061 ◽  
Author(s):  
Hyun Seon Hong ◽  
A. Ran Choi
2011 ◽  
Vol 36 (4) ◽  
pp. 567 ◽  
Author(s):  
Chien-Chung Tsai ◽  
Yen-Sheng Lin ◽  
Shan-Chuang Pei ◽  
Chia-Kai Chang ◽  
Ting-Hao Chen ◽  
...  

2009 ◽  
Vol 1242 ◽  
Author(s):  
Carolina Rickenstorff ◽  
A. S. Ostrovsky

ABSTRACTA simple optical characterization technique is developed for to find the amplitude and phase modulation modes for the twisted nematic liquid crystal display (TN-LCD). The developed technique is based on intensity and pixel shift measurements of the interference pattern obtained from the TN-LCD sandwiched between two polarizers in a modified Young's experiment. Particularly, specimen LC2002 Holoeye is characterized and its amplitude and phase modulation curves as a function of image's gray level, bright B and contrast C are presented.


2002 ◽  
Vol 101 (1) ◽  
pp. 189-200 ◽  
Author(s):  
J. Campos ◽  
A. Márquez ◽  
J. Nicolás ◽  
I. Moreno ◽  
C. Iemmi ◽  
...  

2020 ◽  
Vol 20 (10) ◽  
pp. 1136-1144
Author(s):  
Hong Joo Song ◽  
Jeongno Lee ◽  
Chul Jong Han ◽  
Kyoungwon Park ◽  
Yong Hyun Lee ◽  
...  

1994 ◽  
Vol 345 ◽  
Author(s):  
R. S. Hockett ◽  
J. M. Metz

AbstractThis work is a feasibility study for using Total reflection X-Ray Fluorescence (TXRF) to characterize inorganic contamination at the surface of, and in, liquid crystal display materials as a function of their processing. Five samples were taken from process steps called: Cr black mask, Cr pattern, RGB pattern, topcoat, and ITO, all on glass substrates. TXRF, a glancing angle XRF technique, is sensitive to inorganic elements and can be used to detect inorganic contamination at surfaces. In addition, increasing the glancing angle can lead to penetration of thin films, and thereby to some qualitative depth information for the detected elements. Elements detected in this study included: Al, Si, S, Cl, In/Sn, Ca, Ba, Cr, Fe, Cu, Ni and Zn.


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