Control Chart Pattern Recognition Based on PSO and LS-SVM

2010 ◽  
Vol 17 (1) ◽  
pp. 7-10 ◽  
Author(s):  
Cheng Zhiqiang ◽  
Ma Yizhong
2013 ◽  
Vol 845 ◽  
pp. 696-700
Author(s):  
Razieh Haghighati ◽  
Adnan Hassan

Traditional statistical process control (SPC) charting techniques were developed to monitor process status and helping identify assignable causes. Unnatural patterns in the process are recognized by means of control chart pattern recognition (CCPR) techniques. There are a broad set of studies in CCPR domain, however, given the growing doubts concerning the performance of control charts in presence of constrained data, this area has been overlooked in the literature. This paper, reports a preliminary work to develop a scheme for fault tolerant CCPR that is capable of (i) detecting of constrained data that is sampled in a misaligned uneven fashion and/or be partly lost or unavailable and (ii) accommodating the system in order to improve the reliability of recognition.


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