Hafnia-based resistive switching devices for non-volatile memory applications and effects of gamma irradiation on device performance

2018 ◽  
Vol 173 (3-4) ◽  
pp. 239-249 ◽  
Author(s):  
N. Arun ◽  
K. Vinod Kumar ◽  
A. P. Pathak ◽  
D. K. Avasthi ◽  
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2016 ◽  
Vol 4 (46) ◽  
pp. 10967-10972 ◽  
Author(s):  
Sujaya Kumar Vishwanath ◽  
Jihoon Kim

The all-solution-based memory devices demonstrated excellent bipolar switching behavior with a high resistive switching ratio of 103, excellent endurance of more than 1000 cycles, stable retention time greater than 104s at elevated temperatures, and fast programming speed of 250 ns.


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