Determination of the point group of the icosahedral phase in an Al-Mn-Si alloy using convergent-beam electron diffraction

1986 ◽  
Vol 53 (3) ◽  
pp. L75-L80 ◽  
Author(s):  
L. A. Bendersky ◽  
M. J. Kaufman
2002 ◽  
Vol 382 (4) ◽  
pp. 422-430 ◽  
Author(s):  
Takuya Hashimoto ◽  
Kenji Tsuda ◽  
Junichiro Shiono ◽  
Junichiro Mizusaki ◽  
Michiyoshi Tanaka

1999 ◽  
Vol 589 ◽  
Author(s):  
C. Schuer ◽  
M. Leicht ◽  
T. Marek ◽  
H.P. Strunk

AbstractWe have optimized the sensitivity of convergent beam electron diffraction (CBED) by orienting the specimen such that the central (000) diffraction disc shows a pattern of defect lines that are most sensitive to tetragonal distortion. We compare the position of these lines in the experimentally obtained patterns with results from computer simulations, which need to be based on dynamical diffraction theory. In both experimental and simulated patterns the positions of the defect lines are determined by applying a Hough transformation. As a result of this optimized approach, we can measure the tetragonal distortion of a low temperature grown GaAs layer as low as 0.04%.


2000 ◽  
Vol 69 (7) ◽  
pp. 1939-1941 ◽  
Author(s):  
Kenji Tsuda ◽  
Shuichi Amamiya ◽  
Michiyoshi Tanaka ◽  
Yukio Noda ◽  
Masahiko Isobe ◽  
...  

1992 ◽  
Vol 31 (Part 2, No. 2A) ◽  
pp. L109-L112 ◽  
Author(s):  
Masakazu Saito ◽  
Michiyoshi Tanaka ◽  
An Pang Tsai ◽  
Akihisa Inoue ◽  
Tsuyoshi Masumoto

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