Nonlinear micromechanically analysis of forced vibration of the rectangular-shaped atomic force microscopes incorporating contact model and thermal influences

Geometry distortions of nanostructure edges scanned with amplitude-modulated atomic force microscopes

Measurement Science and Technology ◽

10.1088/0957-0233/24/11/115008 ◽

2013 ◽

Vol 24 (11) ◽

pp. 115008 ◽

Cited By ~ 1

Author(s):

Dorothee Hüser ◽

Wolfgang Häßler-Grohne ◽

Jonathan Hüser

Keyword(s):

Low latency demodulation for Atomic Force Microscopes, Part I efficient real-time integration

Proceedings of the 2011 American Control Conference ◽

10.1109/acc.2011.5991144 ◽

2011 ◽

Cited By ~ 14

Author(s):

Daniel Y. Abramovitch

Keyword(s):

Real Time ◽

Time Integration ◽

Low Latency ◽

Scratch direction and threshold force in nanoscale scratching using atomic force microscopes

Applied Surface Science ◽

10.1016/j.apsusc.2011.04.065 ◽

2011 ◽

Vol 257 (22) ◽

pp. 9243-9250 ◽

Cited By ~ 32

Author(s):

Ampere A. Tseng ◽

Chung-Feng Jeffrey Kuo ◽

Shyankay Jou ◽

Shinya Nishimura ◽

Jun-ichi Shirakashi

Keyword(s):

Threshold Force ◽

1999 IEEE/ASME International Conference on Advanced Intelligent Mechatronics (Cat. No.99TH8399) ◽

On factors affecting the performance of atomic force microscopes in contact-mode

10.1109/aim.1999.803137 ◽

1999 ◽

Cited By ~ 2

Author(s):

O.M. El Rifai ◽

K. Youcef-Toumi

Keyword(s):

Contact Mode ◽

Factors Affecting ◽

Investigation of position detectors for atomic force microscopes

Measurement Science and Technology ◽

10.1088/1361-6501/aad397 ◽

2018 ◽

Vol 29 (10) ◽

pp. 105101 ◽

Cited By ~ 3

Author(s):

Nataliya Vorbringer-Dorozhovets ◽

Rostyslav Mastylo ◽

Eberhard Manske

Keyword(s):

Tip wear and tip breakage in high-speed atomic force microscopes

Ultramicroscopy ◽

10.1016/j.ultramic.2019.03.013 ◽

2019 ◽

Vol 201 ◽

pp. 28-37 ◽

Cited By ~ 6

Author(s):

Timo Strahlendorff ◽

Gaoliang Dai ◽

Detlef Bergmann ◽

Rainer Tutsch

Keyword(s):

High Speed ◽

On the problems of the application of atomic-force microscopes for studying the surface roughness of elements for imaging optics

Journal of Surface Investigation X-ray Synchrotron and Neutron Techniques ◽

10.1134/s102745101304006x ◽

2013 ◽

Vol 7 (4) ◽

pp. 797-801 ◽

Cited By ~ 4

Author(s):

M. M. Barysheva ◽

B. A. Gribkov ◽

M. V. Zorina ◽

N. N. Salashchenko ◽

N. I. Chkhalo

Keyword(s):

Surface Roughness ◽

Atomic Force ◽

Imaging Optics

Piezoelectric scanners for atomic force microscopes: design of lateral sensors, identification and control

Proceedings of the 1999 American Control Conference (Cat. No. 99CH36251) ◽

10.1109/acc.1999.782779 ◽

1999 ◽

Cited By ~ 41

Keyword(s):

Atomic Force ◽

And Control

Chaos Modeling and Control Systems Design - Studies in Computational Intelligence ◽

Intelligent Tracking Control System for Fast Image Scanning of Atomic Force Microscopes

10.1007/978-3-319-13132-0_14 ◽

2014 ◽

pp. 351-391 ◽

Cited By ~ 2

Author(s):

Sajal K. Das ◽

Hemanshu R. Pota ◽

Ian R. Petersen

Keyword(s):

Control System ◽

Tracking Control ◽

Image Scanning ◽

Atomic Force ◽

Intelligent Tracking

Machine learning approach for analyzing complex data from atomic force microscopes

Scilight ◽

10.1063/1.5114991 ◽

2019 ◽

Vol 2019 (25) ◽

pp. 250002

Author(s):

Adam Liebendorfer

Keyword(s):

Machine Learning ◽

Learning Approach ◽

Complex Data ◽

Atomic Force ◽

Machine Learning Approach