On factors affecting the performance of atomic force microscopes in contact-mode

1999 ◽  
Author(s):  
O.M. El Rifai ◽  
K. Youcef-Toumi
Keyword(s):  
Contact Mode ◽  
Factors Affecting ◽  
Atomic Force Microscopes ◽  
Atomic Force

Modal interactions in contact-mode atomic force microscopes

2008 ◽  
Vol 54 (1-2) ◽  
pp. 151-166 ◽  
Author(s):  
Haider N. Arafat ◽  
Ali H. Nayfeh ◽  
Eihab M. Abdel-Rahman
Keyword(s):  
Modal Interactions ◽  
Contact Mode ◽  
Atomic Force Microscopes ◽  
Atomic Force

An Operating Method with Lateral Scan for Reducing the Error in Topography Caused by the Tip-Sample Angle in Atomic Force Microscopy

2010 ◽  
Vol 16 (5) ◽  
pp. 630-635
Author(s):  
Fa-Quan Zhou ◽  
Xue-Zeng Zhao ◽  
Fei Wang ◽  
Yue-Yu Wang
Keyword(s):  
Atomic Force Microscopy ◽  
Topographic Image ◽  
Contact Mode ◽  
Atomic Force Microscopes ◽  
Force Microscopy ◽  
Atomic Force ◽  
Measurement Results ◽  
Parallel Scan ◽  
Operating Method

AbstractThe atomic force microscopes (AFM) images are obtained by keeping the bending of the cantilever unchanged in contact mode. However, it is found that changes in the tip-sample angle during parallel scan result in error in the topographic image. It is also discovered that measurement results obtained in the blind scan region contained large errors. In contrast, regions opposite the blind scan region gave more reliable result. To eliminate this topographic error caused by change in the tip-sample angle, a new operating method with lateral scan is utilized in AFM. Comparative experiments have been performed, and the results show that the error could be eliminated or decreased by using the operating method.

Pole Tip Recession: Investigation of Factors Affecting Its Measurement and Its Variation With Contact Start-Stop and Constant Speed Drag Testing

1995 ◽  
Vol 117 (4) ◽  
pp. 580-587 ◽  
Author(s):  
Chandrasekhar Nadimpalli ◽  
Frank E. Talke ◽  
Martin Smallen ◽  
Jerry J. K. Lee
Keyword(s):  
Dissimilar Materials ◽  
Optical Interferometry ◽  
Constant Speed ◽  
Bearing Surface ◽  
Contact Mode ◽  
Factors Affecting ◽  
Force Microscopy ◽  
Atomic Force ◽  
Pole Tip Recession ◽  
Local Value

Optical interferometry and contact mode atomic force microscopy are used to investigate the various factors that influence the measurement of pole tip recession. These factors include: (a) effect of dissimilar materials on optical interferometry results, (b) size and location of the air bearing surface used as the reference area, (c) the effect of slider crown, (d) the magnification of the objective used in optical interferometry and (e) the dependence of the AFM measurements on slider materials and scan direction of the AFM tip. The possibility of determining a local value of pole tip recession is examined wherein the sputtered alumina, rather than the Al2O3-TiC surface, is used as the reference surface. Finally, the effect of contact start/stop (CSS) and constant speed drag testing on pole tip recession is investigated by measuring the change in pole tip recession as a function of the number of start/stop and constant speed drag cycles.

Improved Control Strategies for Atomic Force Microscopes in Intermittent Contact Mode

2018 ◽  
Vol 26 (5) ◽  
pp. 1673-1684
Author(s):  
Marco Coraggio ◽  
Martin Homer ◽  
Oliver D. Payton ◽  
Mario di Bernardo
Keyword(s):  
Control Strategies ◽  
Contact Mode ◽  
Atomic Force Microscopes ◽  
Atomic Force ◽  
Intermittent Contact

Modal Interactions in Contact-Mode Atomic Force Microscopes

2006 ◽  
Author(s):  
Haider N. Arafat ◽  
Ali H. Nayfeh ◽  
Elihab M. Abdel-Rahman
Keyword(s):  
Multiple Scales ◽  
Contact Stiffness ◽  
Quality Factors ◽  
Modal Interactions ◽  
Internal Resonances ◽  
Approximate Analytical Expression ◽  
Contact Mode ◽  
Linear Coefficient ◽  
Atomic Force Microscopes ◽  
Atomic Force

Atomic force microscopes (AFM) are used to estimate material and surface properties. When using contact-mode AFM, the specimen or the probe is excited near a natural frequency of the system to estimate the linear coefficient of the contact stiffness. Because higher modes offer lower thermal noise, higher quality factors, and higher sensitivity to stiff samples, their use in this procedure is more desirable. However, these modes are candidates for internal resonances, where the energy being fed into one mode may be channeled to another mode. If such interactions are ignored, the results obtained from the probe may be distorted. The method of multiple scales is used to derive an approximate analytical expression to the probe response in the presence of two-to-one autoparametric resonance between the second and third modes. We examine characteristics of this solution in relation to a single-mode response and consider its implications in AFM measurements.

Surface roughness measurements of vanadium-contaminated fluidized cracking catalysts by atomic force microscopy

1996 ◽  
Vol 54 ◽  
pp. 866-867
Author(s):  
H. Kinney ◽  
M.L. Occelli ◽  
S.A.C. Gould
Keyword(s):  
Surface Roughness ◽  
Zeolite Y ◽  
Atomic Level ◽  
Microporous Structure ◽  
Contact Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Before And After ◽  
Roughness Measurements ◽  
Cracking Catalysts

For this study we have used a contact mode atomic force microscope (AFM) to study to topography of fluidized cracking catalysts (FCC), before and after contamination with 5% vanadium. We selected the AFM because of its ability to well characterize the surface roughness of materials down to the atomic level. It is believed that the cracking in the FCCs occurs mainly on the catalysts top 10-15 μm suggesting that the surface corrugation could play a key role in the FCCs microactivity properties. To test this hypothesis, we chose vanadium as a contaminate because this metal is capable of irreversibly destroying the FCC crystallinity as well as it microporous structure. In addition, we wanted to examine the extent to which steaming affects the vanadium contaminated FCC. Using the AFM, we measured the surface roughness of FCCs, before and after contamination and after steaming.We obtained our FCC (GRZ-1) from Davison. The FCC is generated so that it contains and estimated 35% rare earth exchaged zeolite Y, 50% kaolin and 15% binder.

scholarly journals Dynamic friction energy dissipation and enhanced contrast in high frequency bimodal atomic force microscopy

Friction ◽  
2021 ◽  
Author(s):  
Xinfeng Tan ◽  
Dan Guo ◽  
Jianbin Luo
Keyword(s):  
Atomic Force Microscopy ◽  
Energy Dissipation ◽  
Contact Friction ◽  
Measuring Instruments ◽  
Dynamic Friction ◽  
Contact Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Friction Energy ◽  
New Applications

AbstractDynamic friction occurs not only between two contact objects sliding against each other, but also between two relative sliding surfaces several nanometres apart. Many emerging micro- and nano-mechanical systems that promise new applications in sensors or information technology may suffer or benefit from noncontact friction. Herein we demonstrate the distance-dependent friction energy dissipation between the tip and the heterogeneous polymers by the bimodal atomic force microscopy (AFM) method driving the second order flexural and the first order torsional vibration simultaneously. The pull-in problem caused by the attractive force is avoided, and the friction dissipation can be imaged near the surface. The friction dissipation coefficient concept is proposed and three different contact states are determined from phase and energy dissipation curves. Image contrast is enhanced in the intermediate setpoint region. The work offers an effective method for directly detecting the friction dissipation and high resolution images, which overcomes the disadvantages of existing methods such as contact mode AFM or other contact friction and wear measuring instruments.

scholarly journals Redesigned Sensor Holder for an Atomic Force Microscope with an Adjustable Probe Direction

2021 ◽  
Author(s):  
Janik Schaude ◽  
Maxim Fimushkin ◽  
Tino Hausotte
Keyword(s):  
Atomic Force Microscope ◽  
Piezoelectric Actuator ◽  
High Speed ◽  
Closed Loop ◽  
Coefficient Of Thermal Expansion ◽  
Measuring System ◽  
Contact Mode ◽  
Loop Control ◽  
Atomic Force ◽  
Measuring Machine

AbstractThe article presents a redesigned sensor holder for an atomic force microscope (AFM) with an adjustable probe direction, which is integrated into a nano measuring machine (NMM-1). The AFM, consisting of a commercial piezoresistive cantilever operated in closed-loop intermitted contact-mode, is based on two rotational axes, which enable the adjustment of the probe direction to cover a complete hemisphere. The axes greatly enlarge the metrology frame of the measuring system by materials with a comparatively high coefficient of thermal expansion. The AFM is therefore operated within a thermostating housing with a long-term temperature stability of 17 mK. The sensor holder, connecting the rotational axes and the cantilever, inserted one adhesive bond, a soldered connection and a geometrically undefined clamping into the metrology circle, which might also be a source of measurement error. It has therefore been redesigned to a clamped senor holder, which is presented, evaluated and compared to the previous glued sensor holder within this paper. As will be shown, there are no significant differences between the two sensor holders. This leads to the conclusion, that the three aforementioned connections do not deteriorate the measurement precision, significantly. As only a minor portion of the positioning range of the piezoelectric actuator is needed to stimulate the cantilever near its resonance frequency, a high-speed closed-loop control that keeps the cantilever within its operating range using this piezoelectric actuator further on as actuator was implemented and is presented within this article.

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