scholarly journals Drastic influence of micro-alloying on Frank loop nature in Ni and Ni-based model alloys

2020 ◽  
Vol 8 (5) ◽  
pp. 201-207 ◽  
Author(s):  
Kan Ma ◽  
Brigitte Décamps ◽  
Anna Fraczkiewicz ◽  
Frédéric Prima ◽  
Marie Loyer-Prost
Keyword(s):  
Author(s):  
J.A. Lambert ◽  
P.S. Dobson

The defect structure of ion-implanted silicon, which has been annealed in the temperature range 800°C-1100°C, consists of extrinsic Frank faulted loops and perfect dislocation loops, together with‘rod like’ defects elongated along <110> directions. Various structures have been suggested for the elongated defects and it was argued that an extrinsically faulted Frank loop could undergo partial shear to yield an intrinsically faulted defect having a Burgers vector of 1/6 <411>.This defect has been observed in boron implanted silicon (1015 B+ cm-2 40KeV) and a detailed contrast analysis has confirmed the proposed structure.


1974 ◽  
Vol 24 (2) ◽  
pp. K95-K97 ◽  
Author(s):  
E. Bollinger ◽  
M. Condat ◽  
M. Fayard

2008 ◽  
Vol 52 (9(4)) ◽  
pp. 1250-1254 ◽  
Author(s):  
Chansun Shin ◽  
Hyung-Ha Jin ◽  
Jun Hyun Kwon ◽  
Jae-Hyeok Shim ◽  
Thak Sang Byun
Keyword(s):  

1972 ◽  
Vol 20 (7) ◽  
pp. 875-880 ◽  
Author(s):  
P Veyssiere ◽  
R.J Gaboriaud ◽  
J Rabier ◽  
J Grilhe

1972 ◽  
Vol 51 (2) ◽  
pp. 579-587 ◽  
Author(s):  
R. J. Gaboriaud ◽  
J. Grilhé
Keyword(s):  

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