An analysis of the weakest-link model for early electromigration failure
2004 ◽
Vol 37
(14)
◽
pp. 2035-2046
◽
2006 ◽
Vol 129
(2)
◽
pp. 293-303
◽
Keyword(s):
1985 ◽
Vol 3
(1)
◽
pp. 82-89
◽
2000 ◽
Vol 122
(4)
◽
pp. 225-232
◽
Keyword(s):
2013 ◽
Vol 19
(1)
◽
pp. 56-70
◽
1986 ◽
Vol 24
(4)
◽
pp. 495-508
◽
2017 ◽
Vol 53
(2)
◽
pp. 1227-1245
◽
2016 ◽
Vol 152
◽
pp. 193-200
◽
1978 ◽
Vol 100
(2)
◽
pp. 170-174
◽
Keyword(s):
1987 ◽
Vol 22
(3)
◽
pp. 1024-1030
◽