Effect of additives on distributions of lamellar structures in sheared polymer: a study of synchrotron small-angle x-ray scattering

2009 ◽  
Vol 42 (24) ◽  
pp. 245406 ◽  
Author(s):  
Peng-Wei Zhu ◽  
Graham Edward ◽  
Lance Nichols
Keyword(s):  
Small Angle ◽  
X Ray ◽  
Lamellar Structures ◽  
X Ray Scattering ◽  
Effect Of Additives ◽  
Ray Scattering

A deconvolution method of evaluating small-angle X-ray scattering from lamellar structures

1978 ◽  
Vol 11 (5) ◽  
pp. 421-429 ◽  
Author(s):  
E. H. Pape ◽  
W. Kreutz
Keyword(s):  
Small Angle ◽  
Deconvolution Method ◽  
X Ray ◽  
Lamellar Structures ◽  
X Ray Scattering ◽  
Ray Scattering

Quantitative Examination of Semicrystalline Polymers Via Atomic-Force Microscopy, Transmission Electron Microscopy, and Small-Angle X-Ray Scattering

1996 ◽  
Vol 54 ◽  
pp. 182-183
Author(s):  
M. S. Bischel ◽  
S. Balijepalli ◽  
J. M. Schultz
Keyword(s):  
Small Angle ◽  
Chlorosulfonic Acid ◽  
Lamellar Thickness ◽  
X Ray ◽  
Crystalline Polymers ◽  
Lamellar Structures ◽  
X Ray Scattering ◽  
Atomic Force ◽  
First Case ◽  
Ray Scattering

The Atomic Force Microscope (AFM) has been used to reliably measure lamellar thickness in semi-crystalline polymers, and to distinguish phases within blends of these polymers.Traditionally, lamellar thicknesses of semi-crystalline polymers have been determined by (1) measuring structures directly from TEM micrographs or (2) using small angle X-ray scattering (SAXS) spectra. In the first case, the sample must either be etched and replicated, or stained with heavy metals or chlorosulfonic acid to reveal the lamellar structures. Good SAXS measurements require access to a synchrotron, or rotating anode diffractometer. In contrast, the AFM has been used to relaibly measure the lamellar structures in polymer specimens which have undergone minimal sample preparation.The tapping mode of operation of a Digital Nanoprobe AFM has been used on the free surfaces of polyethylene oxide (PEO) specimens to determine lamellar thicknesses that are in excellent agreement with measurements obtained from both TEM and SAXS. Examples of such comparisons in the existing literature are few.

Small-angle X-ray scattering from polyethylene: Distorted lamellar structures

2003 ◽  
Vol 90 (9) ◽  
pp. 2400-2407 ◽  
Author(s):  
Carla Marega ◽  
Antonio Marigo ◽  
Valerio Causin
Keyword(s):  
Small Angle ◽  
X Ray ◽  
Lamellar Structures ◽  
X Ray Scattering ◽  
Ray Scattering

scholarly journals Study of lamellar structures of graft-type fluorinated proton exchange membranes by small-angle X-ray scattering: preparation procedures and grafting degree dependence for fuel application

2015 ◽  
Vol 18 (3) ◽  
pp. 153-161
Author(s):  
Tap Duy Tran ◽  
Hien Minh Pham ◽  
Anh Hoang Nguyen ◽  
Anh Tuan Luong ◽  
Tuyen Anh Luu
Keyword(s):  
Small Angle ◽  
Proton Exchange Membranes ◽  
Proton Exchange ◽  
Lamellar Crystal ◽  
X Ray ◽  
Lamellar Structures ◽  
Operation Conditions ◽  
X Ray Scattering ◽  
Grafting Degree ◽  
Ray Scattering

The variation of lamellar structures of poly(styrenesulfonic acid)-grafted poly (ethylene-co-tetrafluoroethylene) proton exchange membranes dependence on preparation procedures and grafting degree (GD) was investigated by small angle X-ray scattering. The detail structures of lamellar including lamellar period L, thickness of lamellar crystal Lc, thickness of lamellar amorphous La, and linear crystallinity Lc/L were examined by a 1D correlation function. The lamellar structures were recognized at the grafting step and did not change under the sulfonation process. With GD  79 %, Lc significantly decreased (corresponding to the increase of La) and then retained in the GDs of 79-117 %. Note that the retained values of Lc, La, and linear crystallinity in the GDs of 79-117 % are the origin of high conductivity and mechanical strength of membranes under severe operation conditions for fuel cell applications.

Small-angle x-ray scattering of distorted lamellar structures

1993 ◽  
Vol 31 (9) ◽  
pp. 1179-1186 ◽  
Author(s):  
Yuji Sasanuma ◽  
Akihiro Abe ◽  
Takako Sasanuma ◽  
Yukishige Kitano ◽  
Akira Ishitani
Keyword(s):  
Small Angle ◽  
X Ray ◽  
Lamellar Structures ◽  
X Ray Scattering ◽  
Ray Scattering

A Revised O2 Reduction Model in Li-O2 Batteries as Revealed by in Situ Small Angle X-Ray Scattering

2019 ◽  
Author(s):  
Christian Prehal ◽  
Aleksej Samojlov ◽  
Manfred Nachtnebel ◽  
Manfred Kriechbaum ◽  
Heinz Amenitsch ◽  
...  
Keyword(s):  
Small Angle ◽  
Wide Angle ◽  
Reduction Mechanism ◽  
Reduction Model ◽  
X Ray ◽  
X Ray Scattering ◽  
O2 Reduction ◽  
Ray Scattering

<b>Here we use in situ small and wide angle X-ray scattering to elucidate unexpected mechanistic insights of the O2 reduction mechanism in Li-O2 batteries.<br></b>

In situ Time-Resolved Small-Angle X-ray Scattering Reveals the Formation Kinetics of Polyelectrolyte Complex Micelles

2019 ◽  
Author(s):  
Hao Wu ◽  
Jeffrey Ting ◽  
Siqi Meng ◽  
Matthew Tirrell
Keyword(s):  
Small Angle ◽  
Self Assembly ◽  
Electrostatic Interactions ◽  
Polyelectrolyte Complex ◽  
Time Resolved ◽  
X Ray ◽  
X Ray Scattering ◽  
Kinetics Of ◽  
Ray Scattering

We have directly observed the <i>in situ</i> self-assembly kinetics of polyelectrolyte complex (PEC) micelles by synchrotron time-resolved small-angle X-ray scattering, equipped with a stopped-flow device that provides millisecond temporal resolution. This work has elucidated one general kinetic pathway for the process of PEC micelle formation, which provides useful physical insights for increasing our fundamental understanding of complexation and self-assembly dynamics driven by electrostatic interactions that occur on ultrafast timescales.

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