Atomic structure analysis of stacking faults and misfit dislocations at 3C-SiC/Si(0 0 1) interfaces by aberration-corrected transmission electron microscopy

2012 ◽  
Vol 45 (49) ◽  
pp. 494002 ◽  
Author(s):  
J Yamasaki ◽  
S Inamoto ◽  
Y Nomura ◽  
H Tamaki ◽  
N Tanaka
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Structure Analysis ◽  
Atomic Structure ◽  
Stacking Faults ◽  
Misfit Dislocations ◽  
Transmission Electron ◽  
Aberration Corrected

Atomistic Structure Analysis Of 3C-SiC/Si(001) Interface And Stacking Faults By Aberration-Corrected Transmission Electron Microscopy

2012 ◽  
Vol 18 (S2) ◽  
pp. 514-515
Author(s):  
J. Yamasaki ◽  
N. Tanaka ◽  
S. Inamoto ◽  
Y. Nomura ◽  
K. Okazaki-Maeda
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Structure Analysis ◽  
Stacking Faults ◽  
Transmission Electron ◽  
Atomistic Structure ◽  
Aberration Corrected

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Hybrid atomic structure of the Schmid cluster Au55(PPh3)12Cl6 resolved by aberration-corrected STEM

Nanoscale ◽  
2015 ◽  
Vol 7 (3) ◽  
pp. 885-888 ◽  
Author(s):  
Nan Jian ◽  
Christopher Stapelfeldt ◽  
Kuo-Juei Hu ◽  
Michael Fröba ◽  
Richard E. Palmer
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Atomic Structure ◽  
Scanning Transmission Electron Microscopy ◽  
Scanning Transmission Electron ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Aberration Corrected Stem ◽  
Aberration Corrected

We have investigated the atomic structure of the Au55(PPh3)12Cl6 Schmid cluster by using aberration-corrected scanning transmission electron microscopy (STEM) combined with multislice simulation of STEM images.

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