Single-Photon Emission at Liquid Nitrogen Temperature from a Single InAs/GaAs Quantum Dot

2008 ◽  
Vol 25 (9) ◽  
pp. 3231-3233 ◽  
Author(s):  
Dou Xiu-Ming ◽  
Sun Bao-Quan ◽  
Chang Xiu-Ying ◽  
Xiong Yong-Hua ◽  
Huang She-Song ◽  
...  
2008 ◽  
Vol 40 (6) ◽  
pp. 2004-2006 ◽  
Author(s):  
P. Ester ◽  
L. Lackmann ◽  
M.C. Hübner ◽  
S. Michaelis de Vasconcellos ◽  
A. Zrenner ◽  
...  

2006 ◽  
Vol 89 (23) ◽  
pp. 233102 ◽  
Author(s):  
S. Kiravittaya ◽  
M. Benyoucef ◽  
R. Zapf-Gottwick ◽  
A. Rastelli ◽  
O. G. Schmidt

2015 ◽  
Vol 106 (23) ◽  
pp. 233107 ◽  
Author(s):  
Ł. Dusanowski ◽  
M. Syperek ◽  
A. Maryński ◽  
L. H. Li ◽  
J. Misiewicz ◽  
...  

2020 ◽  
Vol 15 (1) ◽  
Author(s):  
Shulun Li ◽  
Yao Chen ◽  
Xiangjun Shang ◽  
Ying Yu ◽  
Jiawei Yang ◽  
...  

APL Materials ◽  
2021 ◽  
Vol 9 (6) ◽  
pp. 061106
Author(s):  
M. J. Holmes ◽  
T. Zhu ◽  
F. C.-P. Massabuau ◽  
J. Jarman ◽  
R. A. Oliver ◽  
...  

2005 ◽  
Vol 03 (supp01) ◽  
pp. 223-228 ◽  
Author(s):  
WEN-CHANG HUNG ◽  
A. ADAWI ◽  
A. TAHRAOUI ◽  
A. G. CULLIS

In order to control light, different strategies have been applied by placing an optically active medium into a semiconductor resonator and certain applications such as LEDs and laser diodes have been commercialized for many years. The possibility of nanoscale optical applications has created great interesting for quantum nanostructure research. Recently, single photon emission has been an active area of quantum dot research. A quantum dot is place between distributed Bragg reflectors (DBRs) within a micro-pillar structure. In this study, we shall report on an active layer composed of an organic material instead of a semiconductor. The micro-pillar structure is fabricated by a focused ion beam (FIB) micro-machining technique. The ultimate target is to achieve a single molecule within the micro-pillar and therefore to enable single photon emission. Here, we demonstrate some results of the fabrication procedure of a 5 micron organic micro-pillar via the focused ion beam and some measurement results from this study. The JEOL 6500 dual column system equipped with both electron and ion beams enables us to observe the fabrication procedure during the milling process. Furthermore, the strategy of the FIB micro-machining method is reported as well.


2006 ◽  
Vol 32 (1-2) ◽  
pp. 144-147 ◽  
Author(s):  
Hidekazu Kumano ◽  
Satoshi Kimura ◽  
Michiaki Endo ◽  
Ikuo Suemune ◽  
Hirotaka Sasakura ◽  
...  

2014 ◽  
Vol 105 (14) ◽  
pp. 141109 ◽  
Author(s):  
Saniya Deshpande ◽  
Thomas Frost ◽  
Arnab Hazari ◽  
Pallab Bhattacharya

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