Variable wavelength photocurrent mapping on PbS quantum dot: fullerene thin films by conductive atomic force microscopy

2011 ◽  
Vol 26 (9) ◽  
pp. 095002 ◽  
Author(s):  
M Madl ◽  
W Brezna ◽  
B Basnar ◽  
M Yarema ◽  
W Heiss ◽  
...  
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Quantum Dot ◽  
Conductive Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Pbs Quantum Dot

Transient Hole Trapping in Individual GeSi Quantum Dot Grown on Si(001) Studied by Conductive Atomic Force Microscopy

2008 ◽  
Vol 25 (12) ◽  
pp. 4360-4363 ◽  
Author(s):  
Wu Rong ◽  
Lin Jian-Hui ◽  
Zhang Sheng-Li ◽  
Yang Hong-Bin ◽  
Jiang Zui-Min ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Quantum Dot ◽  
Conductive Atomic Force Microscopy ◽  
Force Microscopy ◽  
Hole Trapping ◽  
Atomic Force

Local photoconductivity of microcrystalline silicon thin films measured by conductive atomic force microscopy

2011 ◽  
Vol 5 (10-11) ◽  
pp. 373-375 ◽  
Author(s):  
Martin Ledinský ◽  
Antonín Fejfar ◽  
Aliaksei Vetushka ◽  
Jiří Stuchlík ◽  
Bohuslav Rezek ◽  
...  
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Microcrystalline Silicon ◽  
Conductive Atomic Force Microscopy ◽  
Force Microscopy ◽  
Silicon Thin Films ◽  
Atomic Force

Leakage currents at crystallites in ZrAlxOy thin films measured by conductive atomic-force microscopy

2007 ◽  
Vol 90 (23) ◽  
pp. 232901 ◽  
Author(s):  
O. Bierwagen ◽  
L. Geelhaar ◽  
X. Gay ◽  
M. Piešiņš ◽  
H. Riechert ◽  
...  
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Conductive Atomic Force Microscopy ◽  
Leakage Currents ◽  
Force Microscopy ◽  
Atomic Force
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