Non-contact thickness gauging of a thin film using surface waves and a void effect on their propagation

2012 ◽  
Vol 23 (8) ◽  
pp. 085608 ◽  
Author(s):  
S Fourez ◽  
F Jenot ◽  
M Ouaftouh ◽  
M Duquennoy ◽  
M Ourak
2002 ◽  
Vol 27 (8) ◽  
pp. 646 ◽  
Author(s):  
F. Villa ◽  
L. E. Regalado ◽  
F. Ramos-Mendieta ◽  
J. Gaspar-Armenta ◽  
T. Lopez-Ríos

1986 ◽  
Vol 69 (1) ◽  
pp. 112-120
Author(s):  
Yukinari Hayashi ◽  
Kazuya Hayata ◽  
Masanori Koshiba ◽  
Michio Suzuki

1980 ◽  
Vol 58 (11) ◽  
pp. 1525-1537 ◽  
Author(s):  
Yves Levy

We describe the properties of the surface electromagnetic modes which occur in a wave-like manner, along the interface separating two dielectric semi-infinite media. We recall the different methods for using the surface waves as probes of surfaces and interfaces. We show how the surface waves can be used in ultra-thin film Raman spectroscopy.


PAMM ◽  
2007 ◽  
Vol 7 (1) ◽  
pp. 4100033-4100034
Author(s):  
Christian Heining ◽  
Andreas Wierschem ◽  
Nuri Aksel

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