A comparative experimental study on sample excitation and probe excitation in force modulation atomic force microscopy

2013 ◽  
Vol 24 (2) ◽  
pp. 025403 ◽  
Author(s):  
Chunlai Yang ◽  
Yuhang Chen ◽  
Tian Wang ◽  
Wenhao Huang
Keyword(s):  
Experimental Study ◽  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Force Modulation ◽  
Atomic Force

Contact atomic force microscopy using piezoresistive cantilevers in load force modulation mode

2018 ◽  
Vol 184 ◽  
pp. 199-208 ◽  
Author(s):  
P. Biczysko ◽  
A. Dzierka ◽  
G. Jóźwiak ◽  
M. Rudek ◽  
T. Gotszalk ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Load Force ◽  
Force Microscopy ◽  
Force Modulation ◽  
Atomic Force ◽  
Modulation Mode ◽  
Piezoresistive Cantilevers
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