atomic force microscopy probe
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scholarly journals Nanoscale localization of the near-surface nitrogen vacancy center assisted by a silicon atomic force microscopy probe

2021 ◽  
Vol 3 (1) ◽  
pp. 014003
Author(s):  
Xiangyu Ye ◽  
Mengqi Wang ◽  
Pengfei Wang ◽  
Rui Li ◽  
Maosen Guo ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Nitrogen Vacancy ◽  
Atomic Force Microscopy Probe ◽  
Near Surface ◽  
Force Microscopy ◽  
Atomic Force ◽  
Nitrogen Vacancy Center ◽  
Vacancy Center

Tribo-Induced Interfacial Material Transfer of an Atomic Force Microscopy Probe Assisting Superlubricity in a WS2/Graphene Heterojunction

2019 ◽  
Vol 12 (3) ◽  
pp. 4031-4040 ◽  
Author(s):  
Jisen Tian ◽  
Xuan Yin ◽  
Jinjin Li ◽  
Wei Qi ◽  
Peng Huang ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Atomic Force Microscopy Probe ◽  
Material Transfer ◽  
Force Microscopy ◽  
Atomic Force ◽  
Interfacial Material

Fabrication of Polyvinylpyrrolidone Hydrogel Coated Atomic Force Microscopy Probe by E-beam Irradiation for Dip-pen Nanolithography Patterning

2019 ◽  
Vol 686 (1) ◽  
pp. 99-103
Author(s):  
Sinseok Oh ◽  
Pil-seon Kang ◽  
Tae-Sung Ha ◽  
Kyung-Min Kim ◽  
Jung-Hyurk Lim
Keyword(s):  
Atomic Force Microscopy ◽  
Atomic Force Microscopy Probe ◽  
Beam Irradiation ◽  
Force Microscopy ◽  
Atomic Force ◽  
Dip Pen Nanolithography

scholarly journals Fabrication Process of Embedded Silicon Microchannel and Nozzle Structure for Liquid-delivering Atomic Force Microscopy Probe

2019 ◽  
Vol 31 (2) ◽  
pp. 595
Author(s):  
Jinseo Hong ◽  
Yusuke Masuda ◽  
Yoshitaka Miura ◽  
Takayuki Shibata ◽  
Takashi Mineta
Keyword(s):  
Atomic Force Microscopy ◽  
Fabrication Process ◽  
Atomic Force Microscopy Probe ◽  
Force Microscopy ◽  
Atomic Force ◽  
Nozzle Structure

scholarly journals Sensitivity analysis of the electrostatic interaction between the atomic force microscopy probe and a thin dielectric film with 3D-localized charge cloud

2019 ◽  
Vol 125 (4) ◽  
pp. 045305 ◽  
Author(s):  
M. Azib ◽  
F. Baudoin ◽  
N. Binaud ◽  
C. Villeneuve-Faure ◽  
G. Teyssedre ◽  
...  
Keyword(s):  
Sensitivity Analysis ◽  
Atomic Force Microscopy ◽  
Electrostatic Interaction ◽  
Dielectric Film ◽  
Atomic Force Microscopy Probe ◽  
Force Microscopy ◽  
Thin Dielectric Film ◽  
Atomic Force ◽  
Charge Cloud

On the Origin of Extended Resolution in Kelvin Probe Force Microscopy with a Worn Tip Apex

2018 ◽  
Vol 24 (2) ◽  
pp. 126-131 ◽  
Author(s):  
Sergey Y. Luchkin ◽  
Keith J. Stevenson
Keyword(s):  
Atomic Force Microscopy ◽  
Spatial Resolution ◽  
Electrostatic Force ◽  
Experimental Results ◽  
Kelvin Probe Force Microscopy ◽  
Atomic Force Microscopy Probe ◽  
Kelvin Probe ◽  
Force Microscopy ◽  
Atomic Force ◽  
Potential Sensitivity

AbstractIn this work we analyzed the effect of the atomic force microscopy probe tip apex shape on Kelvin Probe Force Microscopy (KPFM) potential sensitivity and spatial resolution. It was found that modification of the apex shape from spherical to planar upon thinning of the conductive coating leads to enhanced apex contribution to the total electrostatic force between the probe and the sample. The effect results in extended potential sensitivity and spatial resolution of KPFM. Experimental results were supported by calculations.

Localized etching of silicon in water using a catalytically active platinum-coated atomic force microscopy probe

2017 ◽  
Vol 50 ◽  
pp. 344-353 ◽  
Author(s):  
Kota Yamamoto ◽  
Keisuke Sato ◽  
Junji Sasano ◽  
Moeto Nagai ◽  
Takayuki Shibata
Keyword(s):  
Atomic Force Microscopy ◽  
Atomic Force Microscopy Probe ◽  
Force Microscopy ◽  
Atomic Force ◽  
Catalytically Active
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