Experimental study of Ni3Al slip traces by atomic force microscopy: an evidence of mobile dislocation exhaustion

2004 ◽  
Vol 387-389 ◽  
pp. 926-930 ◽  
Author(s):  
J. Fikar ◽  
C. Coupeau ◽  
T. Kruml ◽  
J. Bonneville
2000 ◽  
Vol 646 ◽  
Author(s):  
Christophe Coupeau ◽  
Tomas Kruml ◽  
Joël Bonneville

ABSTRACTWe examined by atomic force microscope the slip traces produced on Ni3Al single crystals pre-deformed up to nearly 1% plastic strain at three temperatures in the anomaly domain: 293K, 500K and 720K. It is observed that, whatever the deformation temperature, the slip traces essentially belong to the primary octahedral slip system. The lengths of the slip lines become shorter and shorter with increasing temperature, while the number of dislocations that constitutes the lines is approximately constant. These results are interpreted in terms of a decreasing mean free path of the mobile dislocations when the temperature is raised. The implications of these results in the understanding of the flow stress anomaly are underscored.


2021 ◽  
Vol 91 (10) ◽  
pp. 1560
Author(s):  
В.М. Корнилов ◽  
А.Н. Лачинов ◽  
А.Р. Юсупов

The results of an experimental study of the local electrophysical properties of ultrathin polymer films by atomic force microscopy with a conducting probe are presented. It is established that visualization of current flow sites (conducting channels) is possible in areas from which the surface layer has been mechanically removed. The conducting channels in the current image have the form of individual points with a height corresponding to the locally flowing current. It is found that the location of the observed channels correlates well with the model of conductivity along the grain boundaries of the supramolecular structure of the polymer.


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