Ageing of metal/ultra-thin oxide/semiconductor structures under Fowler–Nordheim current injection

2003 ◽  
Vol 15 (1) ◽  
pp. 237-242 ◽  
Author(s):  
K Kassmi ◽  
A Aziz ◽  
F Olivie
Keyword(s):  
Current Injection ◽  
Oxide Semiconductor ◽  
Semiconductor Structures ◽  
Thin Oxide

Instability analysis of charges trapped in the oxide of metal-ultra thin oxide-semiconductor structures

2005 ◽  
Vol 31 (3) ◽  
pp. 169-178 ◽  
Author(s):  
A. Aziz ◽  
K. Kassmi ◽  
R. Maimouni ◽  
F. Olivié ◽  
G. Sarrabayrouse ◽  
...  
Keyword(s):  
Oxide Semiconductor ◽  
Instability Analysis ◽  
Semiconductor Structures ◽  
Thin Oxide
Sign in / Sign up

Export Citation Format

Share Document