scholarly journals Design of a nanomechanical fluid control valve based on functionalized silicon cantilevers: coupling molecular mechanics with classical engineering design

2004 ◽  
Vol 15 (11) ◽  
pp. 1405-1415 ◽  
Author(s):  
Santiago D Solares ◽  
Mario Blanco ◽  
William A Goddard
2010 ◽  
Vol 4 (4) ◽  
pp. 552-563 ◽  
Author(s):  
Tetsuya AKAGI ◽  
Shujiro DOHTA ◽  
Hirofumi UEDA

2011 ◽  
Vol 5 (6) ◽  
pp. 1251-1263 ◽  
Author(s):  
Tetsuya AKAGI ◽  
Shujiro DOHTA ◽  
Hirofumi UEDA

1974 ◽  
Author(s):  
John Knox ◽  
Walter Hyde ◽  
T.A. Scott
Keyword(s):  

2003 ◽  
Vol 46 (4) ◽  
pp. 1538-1546
Author(s):  
Shinichi YOKOTA ◽  
Yutaka KONDOH ◽  
Kokichi ISHIHARA ◽  
Yasufumi OTSUBO ◽  
Kazuya EDAMURA

Author(s):  
Michael T. Postek

The term ultimate resolution or resolving power is the very best performance that can be obtained from a scanning electron microscope (SEM) given the optimum instrumental conditions and sample. However, as it relates to SEM users, the conventional definitions of this figure are ambiguous. The numbers quoted for the resolution of an instrument are not only theoretically derived, but are also verified through the direct measurement of images on micrographs. However, the samples commonly used for this purpose are specifically optimized for the measurement of instrument resolution and are most often not typical of the sample used in practical applications.SEM RESOLUTION. Some instruments resolve better than others either due to engineering design or other reasons. There is no definitively accurate definition of how to quantify instrument resolution and its measurement in the SEM.


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