Nanoscale in-plane displacement evaluation by AFM scanning and digital image correlation processing

2005 ◽  
Vol 16 (4) ◽  
pp. 344-349 ◽  
Author(s):  
S Chang ◽  
C S Wang ◽  
C Y Xiong ◽  
J Fang
Sign in / Sign up

Export Citation Format

Share Document