Multiple power-law viscoelastic relaxation in time and frequency domains with atomic force microscopy

Author(s):  
Fabricio Barroso de Sousa ◽  
Prem Babu ◽  
Manfred Radmacher ◽  
Claudio Lucas Nunes De Oliveira ◽  
Jeanlex Soares de Sousa
2021 ◽  
Vol 9 ◽  
Author(s):  
D.A.D. Flormann ◽  
C. Anton ◽  
M.O. Pohland ◽  
Y. Bautz ◽  
K. Kaub ◽  
...  

The mechanical properties of cells are important for many biological processes, including wound healing, cancers, and embryogenesis. Currently, our understanding of cell mechanical properties remains incomplete. Different techniques have been used to probe different aspects of the mechanical properties of cells, among them microplate rheology, optical tweezers, micropipette aspiration, and magnetic twisting cytometry. These techniques have given rise to different theoretical descriptions, reaching from simple Kelvin-Voigt or Maxwell models to fractional such as power law models, and their combinations. Atomic force microscopy (AFM) is a flexible technique that enables global and local probing of adherent cells. Here, using an AFM, we indented single retinal pigmented epithelium cells adhering to the bottom of a culture dish. The indentation was performed at two locations: above the nucleus, and towards the periphery of the cell. We applied creep compliance, stress relaxation, and oscillatory rheological tests to wild type and drug modified cells. Considering known fractional and semi-fractional descriptions, we found the extracted parameters to correlate. Moreover, the Young’s modulus as obtained from the initial indentation strongly correlated with all of the parameters from the applied power-law descriptions. Our study shows that the results from different rheological tests are directly comparable. This can be used in the future, for example, to reduce the number of measurements in planned experiments. Apparently, under these experimental conditions, the cells possess a limited number of degrees of freedom as their rheological properties change.


2017 ◽  
Vol 121 (3) ◽  
pp. 034901 ◽  
Author(s):  
J. S. de Sousa ◽  
J. A. C. Santos ◽  
E. B. Barros ◽  
L. M. R. Alencar ◽  
W. T. Cruz ◽  
...  

2009 ◽  
Vol 48 (8) ◽  
pp. 08JB17 ◽  
Author(s):  
Shinichiro Hiratsuka ◽  
Yusuke Mizutani ◽  
Akitoshi Toda ◽  
Norichika Fukushima ◽  
Koichi Kawahara ◽  
...  

2012 ◽  
Vol 102 (3) ◽  
pp. 563a
Author(s):  
Ryosuke Takahashi ◽  
Yusuke Mizutani ◽  
Koichi Kawahara ◽  
Takaharu Okajima

Author(s):  
Can K. Bora ◽  
Michael E. Plesha ◽  
Erin E. Flater ◽  
Mark D. Street ◽  
Robert W. Carpick ◽  
...  

Investigation of contact and friction at multiple length scales is necessary for the design of surfaces in sliding microelectromechanical system (MEMS). A method is developed to investigate the geometry of asperities at different length scales. Analysis of density, height, and curvature of asperities on atomic force microscopy (AFM) images of actual silicon MEMS surfaces show these properties have a power law relationship with the sampling size used to define an asperity. This behavior and its similarity to results for fractal Weierstrass-Mandelbrot (W-M) function approximations indicate that a multiscale model is required to properly describe the surfaces.


2015 ◽  
Vol 51 (99) ◽  
pp. 17619-17622 ◽  
Author(s):  
Chia-Yun Lai ◽  
Tuza Olukan ◽  
Sergio Santos ◽  
Amal Al Ghaferi ◽  
Matteo Chiesa

We report a power law derived from experimental atomic force microscopy (AFM) data suggesting a nano to mesoscale transition in force–distance dependencies.


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