Role of hole trapping in the unintentionally doped GaN layer in suppressing the two-dimensional electron gas degradation in AlGaN/GaN heterostructures on Si

2019 ◽  
Vol 30 (31) ◽  
pp. 314002 ◽  
Author(s):  
Anqi Hu ◽  
Chunyan Song ◽  
Xuelin Yang ◽  
Xiaoying He ◽  
Bo Shen ◽  
...  
1998 ◽  
Vol 249-251 ◽  
pp. 603-606
Author(s):  
H.P van der Meulen ◽  
J Rubio ◽  
J.M Calleja ◽  
C Tejedor ◽  
F Rodriguez ◽  
...  

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