scholarly journals X-ray mapping in a scanning transmission electron microscope of InGaAs quantum dots with embedded fractional monolayers of aluminium

2020 ◽  
Vol 35 (8) ◽  
pp. 084001 ◽  
Author(s):  
T Walther ◽  
J Nutter ◽  
J P Reithmaier ◽  
E M Pavelescu
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