Recording transmitted beam current for X-ray microanalysis in a scanning transmission electron microscope

Journal of Microscopy ◽

10.1111/j.1365-2818.1980.tb04137.x ◽

1980 ◽

Vol 120 (2) ◽

pp. 207-211 ◽

Author(s):

A. T. Marshall

Keyword(s):

Electron Microscope ◽

Transmission Electron Microscope ◽

Beam Current ◽

Scanning Transmission Electron Microscope ◽

Transmitted Beam ◽

X Ray ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission

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X-ray mapping in a scanning transmission electron microscope of InGaAs quantum dots with embedded fractional monolayers of Al

10.22443/rms.emc2020.1436 ◽

2021 ◽

Author(s):

Thomas Walther ◽

Keyword(s):

Quantum Dots ◽

Electron Microscope ◽

Transmission Electron Microscope ◽

Scanning Transmission Electron Microscope ◽

X Ray ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission

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Limitations in the X-ray microanalysis of thin foils in a scanning transmission electron microscope

Journal of Microscopy ◽

10.1111/j.1365-2818.1977.tb00021.x ◽

1977 ◽

Vol 110 (2) ◽

pp. 107-112 ◽

Author(s):

P. Doig ◽

P. E. J. Flewitt

Keyword(s):

Electron Microscope ◽

Transmission Electron Microscope ◽

Scanning Transmission Electron Microscope ◽

X Ray ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission

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Energy dispersive X-ray spectroscopy of bimetallic nanoparticles in an aberration corrected scanning transmission electron microscope

Faraday Discussions ◽

10.1039/b706293c ◽

2008 ◽

Vol 138 ◽

pp. 337-351 ◽

Author(s):

Andrew A. Herzing ◽

Masashi Watanabe ◽

Jennifer K. Edwards ◽

Marco Conte ◽

Zi-Rong Tang ◽

...

Keyword(s):

Electron Microscope ◽

Transmission Electron Microscope ◽

Bimetallic Nanoparticles ◽

Scanning Transmission Electron Microscope ◽

Energy Dispersive ◽

X Ray ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission ◽

Aberration Corrected

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Analytical Electron Microscopy: X-Ray Microanalysis Using the Scanning Transmission Electron Microscope

Electron and Positron Spectroscopies in Materials Science and Engineering ◽

10.1016/b978-0-12-139150-8.50015-4 ◽

1979 ◽

pp. 315-334 ◽

Author(s):

DAVID R. CLARKE

Keyword(s):

Electron Microscopy ◽

Electron Microscope ◽

Transmission Electron Microscope ◽

Analytical Electron Microscopy ◽

Scanning Transmission Electron Microscope ◽

X Ray ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Analytical Electron ◽

Scanning Transmission

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Comment on ‘The spatial resolution of X-ray microanalysis in the scanning transmission electron microscope’

Philosophical Magazine A ◽

10.1080/01418618108235820 ◽

1981 ◽

Vol 44 (6) ◽

pp. 1401-1405 ◽

Author(s):

I. P. Jones

Keyword(s):

Electron Microscope ◽

Spatial Resolution ◽

Transmission Electron Microscope ◽

Scanning Transmission Electron Microscope ◽

X Ray ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission

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Highly spatially resolved X-ray analysis of semiconductor alloys and nanostructures in a scanning transmission electron microscope

Philosophical Magazine A ◽

10.1080/01418619608240733 ◽

1996 ◽

Vol 74 (6) ◽

pp. 1421-1437 ◽

Author(s):

U. Bangert ◽

A. J. Harvey ◽

C. Diekek ◽

A. Hartmann ◽

R. Keyse

Keyword(s):

Electron Microscope ◽

Transmission Electron Microscope ◽

Scanning Transmission Electron Microscope ◽

Semiconductor Alloys ◽

X Ray ◽

Scanning Transmission Electron ◽

Spatially Resolved ◽

Transmission Electron ◽

Scanning Transmission

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Effective absorption correction for energy dispersive X-ray mapping in a scanning transmission electron microscope: analysing the local indium distribution in rough samples of InGaN alloy layers

Journal of Microscopy ◽

10.1111/jmi.12643 ◽

2017 ◽

Vol 268 (3) ◽

pp. 248-253 ◽

Author(s):

X. WANG ◽

M.-P. CHAUVAT ◽

P. RUTERANA ◽

T. WALTHER

Keyword(s):

Electron Microscope ◽

Transmission Electron Microscope ◽

Scanning Transmission Electron Microscope ◽

Energy Dispersive ◽

X Ray ◽

Scanning Transmission Electron ◽

Absorption Correction ◽

Transmission Electron ◽

Scanning Transmission ◽

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X-ray mapping in a scanning transmission electron microscope of InGaAs quantum dots with embedded fractional monolayers of aluminium

Semiconductor Science and Technology ◽

10.1088/1361-6641/ab8c52 ◽

2020 ◽

Vol 35 (8) ◽

pp. 084001 ◽

Author(s):

T Walther ◽

J Nutter ◽

J P Reithmaier ◽

E M Pavelescu

Keyword(s):

Quantum Dots ◽

Electron Microscope ◽

Transmission Electron Microscope ◽

Scanning Transmission Electron Microscope ◽

X Ray ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission

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High Speed and Sensitive X-ray Analysis System with Automated Aberration Correction Scanning Transmission Electron Microscope

Applied Microscopy ◽

10.9729/am.2015.45.1.1 ◽

2015 ◽

Vol 45 (1) ◽

pp. 1-8 ◽

Author(s):

Hiromi Inada ◽

Yoichi Hirayama ◽

Keiji Tamura ◽

Daisuke Terauchi ◽

Ryoji Namekawa ◽

...

Keyword(s):

Electron Microscope ◽

Transmission Electron Microscope ◽

Scanning Transmission Electron Microscope ◽

Aberration Correction ◽

X Ray ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission ◽

Analysis System

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The spatial resolution of X-ray microanalysis in the scanning transmission electron microscope

Philosophical Magazine A ◽

10.1080/01418618008239347 ◽

1980 ◽

Vol 41 (5) ◽

pp. 761-775 ◽

Author(s):

P. Doig ◽

D. Lonsdale ◽

P. E. J. Flewitt

Keyword(s):

Electron Microscope ◽

Spatial Resolution ◽

Transmission Electron Microscope ◽

Scanning Transmission Electron Microscope ◽

X Ray ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission

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