Modification of critical current in HTSC tape conductors by a ferromagnetic layer

Numerically, within the framework of the critical state model, the density of superconducting currents in a second-generation HTSC tape based on GdBa2Cu3O7-x is determined. It is shown that during the restoration of the transverse crack of the superconducting layer by shunting the crack with a piece of defect-free tape, the critical current of the restored area decreases by ~ 8%. It is shown that preliminary irradiation of the crack edges with ions of hydrogen, helium, neon, and oxygen makes it possible to restore the initial value of the critical current. The calculation of the effect of radiation on a superconducting tape was carried out using the SRIM software package

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Critical Current and AC Loss of DI-BSCCO Tape Modified by the Deposition of Ferromagnetic Layer on Edges

IEEE Transactions on Applied Superconductivity ◽

10.1109/tasc.2010.2052050 ◽

2010 ◽

Vol 20 (5) ◽

pp. 2294-2300 ◽

Cited By ~ 10

Author(s):

Serap Safran ◽

Michal Vojenciak ◽

Ali Gencer ◽

Fedor Gomory

Keyword(s):

Critical Current ◽

Ferromagnetic Layer ◽

Ac Loss

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Influence of Ferromagnetic Layer on Critical Current of a Superconducting Wire

Acta Physica Polonica A ◽

10.12693/aphyspola.113.605 ◽

2008 ◽

Vol 113 (1) ◽

pp. 605-608 ◽

Cited By ~ 2

Author(s):

F. Gömöry ◽

M. Vojenčiak ◽

J. Šouc ◽

E. Seiler

Keyword(s):

Critical Current ◽

Ferromagnetic Layer ◽

Superconducting Wire

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Microstructural characterization of YBa2Cu3O7-x thin films formed by metalorganic CVD

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100089718 ◽

1991 ◽

Vol 49 ◽

pp. 1080-1081

Author(s):

P. Lu ◽

W. Huang ◽

C.S. Chern ◽

Y.Q. Li ◽

J. Zhao ◽

...

Keyword(s):

Thin Film ◽

Thin Films ◽

Critical Current Density ◽

Critical Current ◽

Current Density ◽

Film Growth ◽

Chemical Vapor ◽

Microstructural Characterization ◽

Ion Milling ◽

Conventional Grinding

The YBa2Cu3O7-x thin films formed by metalorganic chemical vapor deposition(MOCVD) have been reported to have excellent superconducting properties including a sharp zero resistance transition temperature (Tc) of 89 K and a high critical current density of 2.3x106 A/cm2 or higher. The origin of the high critical current in the thin film compared to bulk materials is attributed to its structural properties such as orientation, grain boundaries and defects on the scale of the coherent length. In this report, we present microstructural aspects of the thin films deposited on the (100) LaAlO3 substrate, which process the highest critical current density.Details of the thin film growth process have been reported elsewhere. The thin films were examined in both planar and cross-section view by electron microscopy. TEM sample preparation was carried out using conventional grinding, dimpling and ion milling techniques. Special care was taken to avoid exposure of the thin films to water during the preparation processes.

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Facet Topography and Dislocation Structure as a Possible Source for Electrical Heterogeneity in [001] TILT Bicrystals of YBa2Cu3O7-δ

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100164155 ◽

1996 ◽

Vol 54 ◽

pp. 338-339

Author(s):

I-Fei Tsu ◽

D.L. Kaiser ◽

S.E. Babcock

Keyword(s):

Grain Boundary ◽

Critical Current Density ◽

Critical Current ◽

Current Density ◽

Electromagnetic Properties ◽

Length Scale ◽

Density Values ◽

Current Densities ◽

Applied Fields ◽

A Current

A current theme in the study of the critical current density behavior of YBa2Cu3O7-δ (YBCO) grain boundaries is that their electromagnetic properties are heterogeneous on various length scales ranging from 10s of microns to ˜ 1 Å. Recently, combined electromagnetic and TEM studies on four flux-grown bicrystals have demonstrated a direct correlation between the length scale of the boundaries’ saw-tooth facet configurations and the apparent length scale of the electrical heterogeneity. In that work, enhanced critical current densities are observed at applied fields where the facet period is commensurate with the spacing of the Abrikosov flux vortices which must be pinned if higher critical current density values are recorded. To understand the microstructural origin of the flux pinning, the grain boundary topography and grain boundary dislocation (GBD) network structure of [001] tilt YBCO bicrystals were studied by TEM and HRTEM.

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