scholarly journals Changes in the optical absorption induced by sequential exposition to short- and long-wavelength radiation in the BTO:Al crystal

2017 ◽  
Vol 169 ◽  
pp. 012005 ◽  
Author(s):  
S M Shandarov ◽  
V G Dyu ◽  
M G Kisteneva ◽  
E S Khudyakova ◽  
S V Smirnov ◽  
...  
Keyword(s):  
Optical Absorption ◽  
Long Wavelength ◽  
Wavelength Radiation

scholarly journals Changes in the optical absorption induced in the Bi12TiO20:Al crystal by exposition to short- and long-wavelength radiation

2016 ◽  
Vol 737 ◽  
pp. 012018
Author(s):  
V G Dyu ◽  
M G Kisteneva ◽  
S M Shandarov ◽  
S V Smirnov ◽  
A S Akrestina ◽  
...  
Keyword(s):  
Optical Absorption ◽  
Long Wavelength ◽  
Wavelength Radiation

scholarly journals Effect of Sequential Exposition to Short- and Long-Wavelength Radiation on the Optical Absorption in the Bismuth Titanium Oxide Crystal Doped by Aluminum

2015 ◽  
Vol 73 ◽  
pp. 131-135 ◽  
Author(s):  
V.G. Dyu ◽  
M.G. Kisteneva ◽  
S.M. Shandarov ◽  
E.S. Khudyakova ◽  
S.V. Smirnov ◽  
...  
Keyword(s):  
Optical Absorption ◽  
Titanium Oxide ◽  
Long Wavelength ◽  
Oxide Crystal ◽  
Wavelength Radiation

Luminescent Methods for the Visualization of Long Wavelength Radiation

1973 ◽  
pp. 668-674
Author(s):  
S. A. Fridman ◽  
E. Ya. Arapova ◽  
N. V. Mitrofanova ◽  
Yu. P. Timofeev ◽  
V. V. Shchaenko
Keyword(s):  
Long Wavelength ◽  
Wavelength Radiation

Measuring Incoming 'Short' and long' Wavelength Radiation with Directional Thermopile Radiometers

1967 ◽  
Vol 10 (4) ◽  
pp. 0462-0463
Author(s):  
T. E. Bond ◽  
S. R. Morrison ◽  
and C. F. Kelly
Keyword(s):  
Long Wavelength ◽  
Wavelength Radiation

scholarly journals A cryogenic magneto-optical device for long wavelength radiation

2020 ◽  
Vol 91 (7) ◽  
pp. 075103
Author(s):  
S. J. Rezvani ◽  
D. Di Gioacchino ◽  
S. Tofani ◽  
A. D’Arco ◽  
C. Ligi ◽  
...  
Keyword(s):  
Optical Device ◽  
Long Wavelength ◽  
Wavelength Radiation

Investigation of surface topology of printed nanoparticle layers using wide-angle low-Qscattering

2014 ◽  
Vol 21 (3) ◽  
pp. 547-553 ◽  
Author(s):  
Emmanuel O. Jonah ◽  
Margit Härting ◽  
Eric Gullikson ◽  
Andrew Aquila ◽  
David T. Britton
Keyword(s):  
Small Angle ◽  
Specular Reflection ◽  
Rough Surfaces ◽  
Small Angle Scattering ◽  
Surface Topology ◽  
X Rays ◽  
Long Wavelength ◽  
Angle Scattering ◽  
Wavelength Radiation ◽  
Scattered Beam

A new small-angle scattering technique in reflection geometry is described which enables a topological study of rough surfaces. This is achieved by using long-wavelength soft X-rays which are scattered at wide angles but in the low-Qrange normally associated with small-angle scattering. The use of nanometre-wavelength radiation restricts the penetration to a thin surface layer which follows the topology of the surface, while moving the scattered beam to wider angles preventing shadowing by the surface features. The technique is, however, only applicable to rough surfaces for which there is no specular reflection, so that only the scattered beam was detected by the detector. As an example, a study of the surfaces of rough layers of silicon produced by the deposition of nanoparticles by blade-coating is presented. The surfaces of the blade-coated layers have rough features of the order of several micrometers. Using 2 nm and 13 nm X-rays scattered at angular ranges of 5° ≤ θ ≤ 51° and 5° ≤ θ ≤ 45°, respectively, a combined range of scattering vector of 0.00842 Å−1≤Q≤ 0.4883 Å−1was obtained. Comparison with previous transmission SAXS and USAXS studies of the same materials indicates that the new method does probe the surface topology rather than the internal microstructure.

scholarly journals Ground-State Cooling of a Trapped Ion Using Long-Wavelength Radiation

2015 ◽  
Vol 115 (1) ◽  
Author(s):  
S. Weidt ◽  
J. Randall ◽  
S. C. Webster ◽  
E. D. Standing ◽  
A. Rodriguez ◽  
...  
Keyword(s):  
Ground State ◽  
Long Wavelength ◽  
Trapped Ion ◽  
Wavelength Radiation ◽  
Ground State Cooling

Use of nematic liquid crystals in recording long-wavelength radiation

1975 ◽  
Vol 5 (2) ◽  
pp. 249-250 ◽  
Author(s):  
L M Klyukin ◽  
I D Samodurova ◽  
Anatolii S Sonin
Keyword(s):  
Liquid Crystals ◽  
Nematic Liquid Crystals ◽  
Long Wavelength ◽  
Wavelength Radiation

scholarly journals Initial phases from phosphate SAD in the direct methods determination of RNA

2014 ◽  
Vol 70 (a1) ◽  
pp. C612-C612
Author(s):  
Blaine Mooers ◽  
Tzanko Doukov ◽  
Tina McKay ◽  
Akila Venkataramany ◽  
Victoria Mooers
Keyword(s):  
Diffraction Data ◽  
Structure Determination ◽  
Hybrid Approach ◽  
Direct Methods ◽  
Atomic Resolution ◽  
Anomalous Diffraction ◽  
Long Wavelength ◽  
Minimum Number ◽  
Wavelength Radiation ◽  
Phase Angles

Atomic resolution diffraction data from crystals of double-stranded RNAs can often resist automated structure determination by ab initio methods including charge flipping and traditional direct methods. Often it is possible to obtain quick success at direct methods structure determination by supplying the positions of one or more heavier atoms, which are used to calculate a starting set of phase angles. Long wavelength radiation such as that near the iron K absorption edge can be used to measure the weak anomalous diffraction data from phosphorous atoms in the RNA backbones. These anomalous diffraction data can be used to locate the positions of some of the phosphorous atoms. Next, the phosphorous positions can be used to provide initial phases for direct methods structure determination with atomic resolution diffraction data collected with shorter wavelength radiation. We tested this hybrid approach with two double-stranded RNAs, one with 31 unique phosphates and a second with 44 unique phosphates. We used a combination of programs including those in the CCP4, SHELX, and Sir program suites. We varied the number of sweeps of images collected at the iron edge to find the minimum number (and hence minimum exposure) required to find enough of the phosphate substructure for success at direct methods with the native data before collecting atomic resolution diffraction data with the short wavelength radiation. Our results suggest that diffraction data could be collected at these two wavelengths from a single crystal to avoid problems with non-isomorphism.

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