Correlation Factors for Impurity Diffusion—fcc Lattice

1962 ◽  
Vol 128 (5) ◽  
pp. 2169-2174 ◽  
Author(s):  
John R. Manning
Author(s):  
Fuming Chu ◽  
D. P. Pope ◽  
D. S. Zhou ◽  
T. E. Mitchell

A C15 Laves phase, HfV2+Nb, shows promising mechanical properties and here we describe the structure of its grain boundaries. The C15 Laves phase has a fcc lattice with a=7.4Å. An alloy of composition Hf14V64Nb22 (including a C15 matrix and a second phase of V-rich bcc solution) was made by arc-melting. The alloy was homogenized at 1200°C for 120h. Preliminary study concentrated on Σ3{<110>/70.53°} grain boundaries in the C15 phase using Philips 400T and CM 30 microscopes.The most-commonly observed morphology of Σ3{<110>/70.53°} grain boundaries in the C15 phase is a faceted boundary. A bright field image (BFI) of the faceted boundary and the corresponding diffraction patterns with the grain boundary edge-on are shown in Fig. 1(a). From the diffraction patterns using a <110> zone axis for both grains, it is obvious that this is a Σ3{<110>/70.53°} grain boundary. Crystallographic analysis shows that the Σ3{<110>/70.53°} grain boundaries selectively facet with the following relationships between the two grains: {111}1//{111}2, {112}1//{112}2, {111}1//{115}2, and {001}1//{221}2.


Author(s):  
A. Thust ◽  
K. Urban

The alloy of composition Ni4Mo develops, at temperatures below 860 °C, an ordered Dla-structure which is based on the fcc-lattice. This alloy has been widely investigated with respect to its physical properties and its ordering behaviour. High resolution studies are rare and concentrated mainly on its short-range order structure. The aim of the present work was to develop a detailed understanding of image contrast and to apply the results to antiphase-boundary studies in ordered Ni4Mo by means of a JEOL 4000 EX electron microscope.In high-resolution electron microscopy, depending on defocus and foil thickness, a large variety of different images is obtained. Only a few of these allow a direct interpretation concerning the location and the type of the atoms. By computing a through-focus/through-thickness map (TFTT map) before starting experimental work it is possible to determine the proper conditions at which images can be obtained which are closely related to the projected potential.


2006 ◽  
Vol 74 (3) ◽  
pp. 249-266 ◽  
Author(s):  
Laura D. Goodwin ◽  
Nancy L. Leech
Keyword(s):  

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