Internally consistent approach for modeling solid-state aggregation. I. Atomistic calculations of vacancy clustering in silicon
Keyword(s):
2020 ◽
Vol 30
(25)
◽
pp. 2002494
◽
2020 ◽
Vol 59
(40)
◽
pp. 17467-17471
◽
1997 ◽
Vol 119
(40)
◽
pp. 9366-9376
◽
2000 ◽
pp. 3881-3884
◽
1999 ◽
Vol 580
(2)
◽
pp. 363-369
◽