Electron mass shift in an intense plane wave

We explore the effects of radiation damping on electrons in a high intensity laser pulse. From classical simulations it is found that an electron can get captured in the beam focus, solely because of its radiation back reaction. This capture regime is considered in the context of an intensity-dependent mass shift of the electron. It is demonstrated that the mass shift is not just a classical effect, occurring also in the (strong field) QED theory. Using the QED process of nonlinear Compton scattering as an example, we show that the condition for the onset of electron capture is the same as the definition of the center-of-mass frame for the effective mass kinematics.

Download Full-text

Evidence of electron mass-shift in the forward scattered radiation from a laser-air spark

Physics Letters A ◽

10.1016/0375-9601(70)90758-9 ◽

1970 ◽

Vol 33 (4) ◽

pp. 245-246 ◽

Cited By ~ 6

Author(s):

Y.W. Chan

Keyword(s):

Scattered Radiation ◽

Mass Shift ◽

Electron Mass

Download Full-text

Electron mass shift in nonthermal systems

Journal of Physics B Atomic Molecular and Optical Physics ◽

10.1088/0953-4075/41/12/125001 ◽

2008 ◽

Vol 41 (12) ◽

pp. 125001 ◽

Cited By ~ 1

Author(s):

P L Hagelstein ◽

I U Chaudhary

Keyword(s):

Mass Shift ◽

Electron Mass

Download Full-text

On the Usage of Tapered Undulators in the Measurement of Interference in the Intensity-Dependent Electron Mass Shift

Crystals ◽

10.3390/cryst11050486 ◽

2021 ◽

Vol 11 (5) ◽

pp. 486

Author(s):

Maksim A. Valialshchikov ◽

Marcel Ruijter ◽

Sergey G. Rykovanov

Keyword(s):

Laser Pulse ◽

Emission Line ◽

Pulse Shape ◽

Electron Beams ◽

Thomson Scattering ◽

Mass Shift ◽

Electron Mass ◽

Laser Pulse Shape

In nonlinear Thomson scattering, the main emission line and its harmonics form a band-like structure due to the laser pulse shape induced ponderomotive broadening. We propose to use tapered undulators to mimic Thomson scattering and measure the intensity-dependent electron mass shift experimentally. We also numerically show that the effect is observable for realistic electron beams like in DESY or SKIF.

Download Full-text

Intensity-Dependent Electron Mass Shift in a Laser Field: Existence, Universality, and Detection

Physical Review Letters ◽

10.1103/physrevlett.109.100402 ◽

2012 ◽

Vol 109 (10) ◽

Cited By ~ 63

Author(s):

Chris Harvey ◽

Thomas Heinzl ◽

Anton Ilderton ◽

Mattias Marklund

Keyword(s):

Laser Field ◽

Mass Shift ◽

Electron Mass

Download Full-text

Search for an Electron Mass Shift inCs133in an Intense Electromagnetic Field

Physical Review D ◽

10.1103/physrevd.3.43 ◽

1971 ◽

Vol 3 (1) ◽

pp. 43-51 ◽

Cited By ~ 9

Author(s):

J. Richard Mowat ◽

Charles E. Johnson ◽

Howard A. Shugart ◽

Vernon J. Ehlers

Keyword(s):

Electromagnetic Field ◽

Mass Shift ◽

Electron Mass

Download Full-text

Theory and Errors in Stereo Electron Microscopy

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100101426 ◽

1968 ◽

Vol 26 ◽

pp. 336-337

Author(s):

J. M. Pankratz

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Plane Wave ◽

Focal Length ◽

Foil Thickness ◽

Points Of Interest ◽

Transmission Electron ◽

Vertical Spacing ◽

Illuminating System

It is often desirable in transmission electron microscopy to know the vertical spacing of points of interest within a specimen. However, in order to measure a stereo effect, one must have two pictures of the same area taken from different angles, and one must have also a formula for converting measured differences between corresponding points (parallax) into a height differential.Assume (a) that the impinging beam of electrons can be considered as a plane wave and (b) that the magnification is the same at the top and bottom of the specimen. The first assumption is good when the illuminating system is overfocused. The second assumption (the so-called “perspective error”) is good when the focal length is large (3 x 107Å) in relation to foil thickness (∼103 Å).

Download Full-text