Disruptions with runaway electron generation have been deliberately induced by injection of argon using a disruption mitigation valve. A second disruption mitigation valve has been utilised to inject varying amounts of helium after a short time delay. No generation of runaway electrons has been observed when more than a critical amount of helium has been injected no later than 5 ms after the triggering of the first valve. The required amount of helium for suppression of runaway electron generation is up to one order of magnitude lower than the critical density according to Connor & Hastie (1975) and Rosenbluth & Putvinski (1997).
Effective Critical Electric Field for Runaway-Electron Generation
