Low-Frequency Noise Probe of Interacting Charge Dynamics in Variable-Range Hopping Boron-Doped Silicon
1997 ◽
Vol 79
(20)
◽
pp. 3986-3989
◽
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2013 ◽
Vol 60
(12)
◽
pp. 4206-4212
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Keyword(s):
HEMTs for low-power and low-frequency noise 4.2 K cryoelectronics : fabrication and characterization
1998 ◽
Vol 08
(PR3)
◽
pp. Pr3-131-Pr3-134
◽
Keyword(s):
Keyword(s):
1999 ◽
2002 ◽
Keyword(s):
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