By orienting a crystal grain with its diffraction vector along the sample rotation axis, it is possible to use powerful tomographic and topographic imaging techniques to reconstruct the three-dimensional grain shape inside a polycrystalline sample. The acquisition and reconstruction can be performed from projection images with the detector positioned either in the diffracted-beam or in the direct-beam position. In the first case, the projection data consist of a series of integrated, monochromatic beam X-ray diffraction topographs of the grain under investigation. In the second case, the corresponding diffraction contrast in the transmitted beam may be interpreted as an additional contribution to the X-ray attenuation coefficient of the material. This latter variant is restricted to grains with small orientation spread but offers the possibility to characterize simultaneously the three-dimensional grain shape and the absorption microstructure of the surrounding sample material. The contrast mechanism is sensitive to local strain fields and can, in certain cases, reveal details of the grain microstructure, such as the presence of second-phase inclusions. The methodology is successfully demonstrated on an aluminium polycrystal, with a resulting three-dimensional mapping accuracy better than 7 µm. The possibilities and limitations of the technique are listed and its performance relative to other three-dimensional mapping techniques is discussed.
X-ray coherent diffraction imaging with an objective lens: Towards three-dimensional mapping of thick polycrystals
