scholarly journals Three-dimensional Bragg coherent diffraction imaging of an extended ZnO crystal

2012 ◽  
Vol 45 (4) ◽  
pp. 778-784 ◽  
Author(s):  
Xiaojing Huang ◽  
Ross Harder ◽  
Steven Leake ◽  
Jesse Clark ◽  
Ian Robinson
Keyword(s):  
Three Dimensional ◽  
Partial Coherence ◽  
Reconstruction Process ◽  
X Ray ◽  
Coherent Diffraction Imaging ◽  
Quantitative Image ◽  
Diffraction Imaging ◽  
Zno Crystal ◽  
Comprehensive Characterization

A complex three-dimensional quantitative image of an extended zinc oxide (ZnO) crystal has been obtained using Bragg coherent diffraction imaging integrated with ptychography. By scanning a 2.5 µm-long arm of a ZnO tetrapod across a 1.3 µm X-ray beam with fine step sizes while measuring a three-dimensional diffraction pattern at each scan spot, the three-dimensional electron density and projected displacement field of the entire crystal were recovered. The simultaneously reconstructed complex wavefront of the illumination combined with its coherence properties determined by a partial coherence analysis implemented in the reconstruction process provide a comprehensive characterization of the incident X-ray beam.

Quantitative nanotomography of amorphous and polycrystalline samples using coherent X-ray diffraction

2019 ◽  
Vol 52 (3) ◽  
pp. 571-578 ◽  
Author(s):  
Y. Chushkin ◽  
F. Zontone ◽  
O. Cherkas ◽  
A. Gibaud
Keyword(s):  
Mass Density ◽  
Three Dimensional ◽  
X Ray Diffraction ◽  
X Ray ◽  
Coherent Diffraction Imaging ◽  
Diffraction Imaging ◽  
Diffraction Patterns ◽  
Better Than

This article presents a combined approach where quantitative forward-scattering coherent diffraction imaging (CDI) is supported by crystal diffraction using 8.1 keV synchrotron X-ray radiation. The method allows the determination of the morphology, mass density and crystallinity of an isolated microscopic specimen. This approach is tested on three homogeneous samples made of different materials with different degrees of crystallinity. The mass density and morphology are revealed using three-dimensional coherent diffraction imaging with a resolution better than 36 nm. The crystallinity is extracted from the diffraction profiles measured simultaneously with coherent diffraction patterns. The presented approach extends CDI to structural characterization of samples when crystallinity aspects are of interest.

Incorporating particle symmetry into orientation determination in single-particle imaging

2018 ◽  
Vol 74 (5) ◽  
pp. 512-517
Author(s):  
Miklós Tegze ◽  
Gábor Bortel
Keyword(s):  
Three Dimensional ◽  
Symmetric Case ◽  
X Ray Diffraction ◽  
X Ray ◽  
Coherent Diffraction Imaging ◽  
Diffraction Imaging ◽  
Diffraction Patterns ◽  
Particle Imaging ◽  
Single Particle Imaging ◽  
Orientation Determination

In coherent-diffraction-imaging experiments X-ray diffraction patterns of identical particles are recorded. The particles are injected into the X-ray free-electron laser (XFEL) beam in random orientations. If the particle has symmetry, finding the orientation of a pattern can be ambiguous. With some modifications, the correlation-maximization method can find the relative orientations of the diffraction patterns for the case of symmetric particles as well. After convergence, the correlation maps show the symmetry of the particle and can be used to determine the symmetry elements and their orientations. The C factor, slightly modified for the symmetric case, can indicate the consistency of the assembled three-dimensional intensity distribution.

Framework for three-dimensional coherent diffraction imaging by focused beam x-ray Bragg ptychography

2011 ◽  
Vol 36 (12) ◽  
pp. 2227 ◽  
Author(s):  
Stephan O. Hruszkewycz ◽  
Martin V. Holt ◽  
Ash Tripathi ◽  
Jörg Maser ◽  
Paul H. Fuoss
Keyword(s):  
Three Dimensional ◽  
X Ray ◽  
Coherent Diffraction Imaging ◽  
Diffraction Imaging ◽  
Focused Beam

scholarly journals Three Dimensional Variable-Wavelength X-Ray Bragg Coherent Diffraction Imaging

2016 ◽  
Vol 117 (22) ◽  
Author(s):  
W. Cha ◽  
A. Ulvestad ◽  
M. Allain ◽  
V. Chamard ◽  
R. Harder ◽  
...  
Keyword(s):  
Three Dimensional ◽  
X Ray ◽  
Coherent Diffraction Imaging ◽  
Diffraction Imaging ◽  
Dimensional Variable

Coherent diffraction imaging: consistency of the assembled three-dimensional distribution

2016 ◽  
Vol 72 (4) ◽  
pp. 459-464 ◽  
Author(s):  
Miklós Tegze ◽  
Gábor Bortel
Keyword(s):  
Structural Information ◽  
Three Dimensional ◽  
Atomic Scale ◽  
Short Pulses ◽  
X Ray ◽  
Coherent Diffraction Imaging ◽  
Imaging Experiment ◽  
Dimensional Distribution ◽  
Diffraction Imaging ◽  
Diffraction Patterns

The short pulses of X-ray free-electron lasers can produce diffraction patterns with structural information before radiation damage destroys the particle. From the recorded diffraction patterns the structure of particles or molecules can be determined on the nano- or even atomic scale. In a coherent diffraction imaging experiment thousands of diffraction patterns of identical particles are recorded and assembled into a three-dimensional distribution which is subsequently used to solve the structure of the particle. It is essential to know, but not always obvious, that the assembled three-dimensional reciprocal-space intensity distribution is really consistent with the measured diffraction patterns. This paper shows that, with the use of correlation maps and a single parameter calculated from them, the consistency of the three-dimensional distribution can be reliably validated.

scholarly journals Micro-beam Laue alignment of multi-reflection Bragg coherent diffraction imaging measurements

2017 ◽  
Vol 24 (5) ◽  
pp. 1048-1055 ◽  
Author(s):  
Felix Hofmann ◽  
Nicholas W. Phillips ◽  
Ross J. Harder ◽  
Wenjun Liu ◽  
Jesse N. Clark ◽  
...  
Keyword(s):  
Focused Ion Beam ◽  
Lattice Strain ◽  
Ion Beam ◽  
Strain Tensor ◽  
Three Dimensional ◽  
Stress Fields ◽  
X Ray Diffraction ◽  
X Ray ◽  
Coherent Diffraction Imaging ◽  
Diffraction Imaging

Multi-reflection Bragg coherent diffraction imaging has the potential to allow three-dimensional (3D) resolved measurements of the full lattice strain tensor in specific micro-crystals. Until now such measurements were hampered by the need for laborious, time-intensive alignment procedures. Here a different approach is demonstrated, using micro-beam Laue X-ray diffraction to first determine the lattice orientation of the micro-crystal. This information is then used to rapidly align coherent diffraction measurements of three or more reflections from the crystal. Based on these, 3D strain and stress fields in the crystal are successfully determined. This approach is demonstrated on a focused ion beam milled micro-crystal from which six reflections could be measured. Since information from more than three independent reflections is available, the reliability of the phases retrieved from the coherent diffraction data can be assessed. Our results show that rapid, reliable 3D coherent diffraction measurements of the full lattice strain tensor in specific micro-crystals are now feasible and can be successfully carried out even in heavily distorted samples.

scholarly journals High-Resolution Three-Dimensional X-Ray Microscopy

MRS Bulletin ◽  
2004 ◽  
Vol 29 (3) ◽  
pp. 152-156 ◽  
Author(s):  
Bennett C. Larson ◽  
Bruno Lengeler
Keyword(s):  
Large Angle ◽  
Three Dimensional ◽  
Crystalline Materials ◽  
X Ray ◽  
Spatially Resolved ◽  
Coherent Diffraction Imaging ◽  
Diffraction Imaging ◽  
Ray Projection ◽  
The Individual ◽  
Structure Orientation

AbstractThis issue of MRS Bulletin focuses on the rapid progress that is ongoing in the development of hard x-ray microscopies with three-dimensional spatial resolutions ranging from micrometers to nanometers. The individual articles provide a crosscut of developments in hard x-ray projection tomography microscopy for imaging density and chemical fluctuations in crystalline and noncrystalline materials; large-angle diffractionbased, spatially resolved imaging of local structure, orientation, and strain distributions in crystalline materials; and emerging coherent diffraction imaging for nanometer-range Fourier transform imaging of crystalline and noncrystalline materials.

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