Anisotropic strain in YBa2Cu3O7−δfilms analysed by deconvolution of two-dimensional intensity data
Keyword(s):
X Ray
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The influence of the instrumental resolution on two-dimensional reflection profiles of epitaxic YBa2Cu3O7−δfilms on SrTiO3(001) has been studied in order to investigate the strain in the superconducting films. The X-ray diffraction intensity data were obtained by two-dimensional scans in reciprocal space (q-scan). Since the reflection broadening caused by the apparatus differs for each position in reciprocal space, a highly crystalline substrate was used as a standard. Thus it was possible to measure a standard very close to the YBa2Cu3O7−δreflections in reciprocal space. The two-dimensional deconvolution of reflections by a new computer program revealed an anisotropic strain of the two twinning systems of the film.
2014 ◽
Vol 47
(1)
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pp. 365-377
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1983 ◽
Vol 386
(1791)
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pp. 333-345
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Keyword(s):