Barium disphosphate tungsten bronzes, BaP4O8(WO3)2 m : X-ray diffraction and high-resolution electron microscopy study

1984 ◽  
Vol 40 (3) ◽  
pp. 249-256 ◽  
Author(s):  
B. Domengès ◽  
M. Hervieu ◽  
B. Raveau
1987 ◽  
Vol 61 (4) ◽  
pp. 1422-1428 ◽  
Author(s):  
Amanda K. Petford‐Long ◽  
Mary Beth Stearns ◽  
C.‐H. Chang ◽  
S. R. Nutt ◽  
D. G. Stearns ◽  
...  

Author(s):  
J. Lindner ◽  
A. Sachdev ◽  
M.A. Villa-Garcia ◽  
J. Schwank

The removal of sulfur from petroleum feedstocks is of great importance to the oil industry. The process, known as hydrodesulfurization (HDS), is typically catalyzed by Group VIB metal oxides. The workhorse of the industry today is an alumina supported CoO-MoO3 catalyst. Recently, several models have been proposed for the active site responsible for HDS activity, but despite extensive research efforts there is still no clear relationship between structure and activity. We have prepared promoted and non-stoichiometric catalyst samples via a novel solid state synthesis route. These catalysts are not only quite active in the HDS of thiophene, but are also more thermally stable and consequently easier to characterize than the standard HDS materials prepared by wet chemistry methods. Most studies on HDS catalysts rely on bulk techniques for characterization analysis, however, these do not provide any information at the microscopic level where catalysis occurs. For that reason we have used analytical and high resolution electron microscopy to obtain information at the atomic level, coupled with bulk techniques such as x-ray diffraction and surface area measurements. The objective was to develop a link between the microstructure of our solid state catalysts and their HDS activity.


2016 ◽  
Vol 18 (43) ◽  
pp. 30183-30188 ◽  
Author(s):  
H. E. du Plessis ◽  
J. P. R. de Villiers ◽  
A. Tuling ◽  
E. J. Olivier

Supported cobalt Fischer–Tropsch catalysts are characteristically nanoparticulate and the reduced SiC supported catalyst was found to contain both HCP and FCC polymorphs.


1980 ◽  
Vol 2 ◽  
Author(s):  
Fernando A. Ponce

ABSTRACTThe structure of the silicon-sapphire interface of CVD silicon on a (1102) sapphire substrate has been studied in crøss section by high resolution transmission electron microscopy. Multibeam images of the interface region have been obtained where both the silicon and sapphire lattices are directly resolved. The interface is observed to be planar and abrupt to the instrument resolution limit of 3 Å. No interfacial phase is evident. Defects are inhomogeneously distributed at the interface: relatively defect-free regions are observed in the silicon layer in addition to regions with high concentration of defects.


Sign in / Sign up

Export Citation Format

Share Document