New hot-carrier degradation mode and lifetime prediction method in quarter-micrometer PMOSFET
1992 ◽
Vol 39
(2)
◽
pp. 404-408
◽
1990 ◽
Vol 37
(5)
◽
pp. 1301-1307
◽
Keyword(s):
2001 ◽
Vol 41
(11)
◽
pp. 1909-1913
◽
Keyword(s):
Keyword(s):
1998 ◽
Vol 38
(6-8)
◽
pp. 1103-1107
◽
Keyword(s):
Keyword(s):
1995 ◽
Vol 42
(5)
◽
pp. 957-962
◽