A lifetime prediction method for hot-carrier degradation in surface-channel p-MOS devices
1990 ◽
Vol 37
(5)
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pp. 1301-1307
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Keyword(s):
1992 ◽
Vol 39
(2)
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pp. 404-408
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2001 ◽
Vol 41
(11)
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pp. 1909-1913
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Keyword(s):
Keyword(s):
1998 ◽
Vol 38
(6-8)
◽
pp. 1103-1107
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Keyword(s):
2008 ◽
Vol 42
(2)
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pp. 87-94
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