A New Approach of Hot-Carrier Degradation and Lifetime Prediction for N-MOS Transistors

2006 ◽  
Author(s):  
F. Kacar ◽  
A. Kuntman ◽  
H. Kuntman
Keyword(s):  
Lifetime Prediction ◽  
Mos Transistors ◽  
New Approach ◽  
Hot Carrier ◽  
Hot Carrier Degradation

ANALYSIS OF HOT CARRIER DEGRADATION IN AC STRESSED N-CHANNEL MOS TRANSISTORS USING THE CHARGE PUMPING TECHNIQUE

1988 ◽  
Vol 49 (C4) ◽  
pp. C4-651-C4-655 ◽  
Author(s):  
R. BELLENS ◽  
P. HEREMANS ◽  
G. GROESENEKEN ◽  
H. E. MAES
Keyword(s):  
Mos Transistors ◽  
Charge Pumping ◽  
Hot Carrier ◽  
Hot Carrier Degradation

A new hot carrier degradation law for MOSFET lifetime prediction

1998 ◽  
Vol 38 (6-8) ◽  
pp. 1103-1107 ◽  
Author(s):  
B. Marchand ◽  
G. Ghibaudo ◽  
F. Balestra ◽  
G. Guégan ◽  
S. Deleonibus
Keyword(s):  
Lifetime Prediction ◽  
Hot Carrier ◽  
Hot Carrier Degradation

Hot carrier degradation and a new lifetime prediction model in ultra-deep sub-micron pMOSFET

2013 ◽  
Vol 22 (4) ◽  
pp. 047304 ◽  
Author(s):  
Xiao-Yi Lei ◽  
Hong-Xia Liu ◽  
Kai Zhang ◽  
Yue Zhang ◽  
Xue-Feng Zheng ◽  
...  
Keyword(s):  
Prediction Model ◽  
Lifetime Prediction ◽  
Hot Carrier ◽  
Hot Carrier Degradation

Deuterium isotope effect for AC and DC hot-carrier degradation of MOS transistors: a comparison study

2001 ◽  
Vol 48 (4) ◽  
pp. 813-815
Author(s):  
Zhi Chen ◽  
Kangguo Cheng ◽  
Jinju Lee ◽  
J.W. Lyding ◽  
K. Hess ◽  
...  
Keyword(s):  
Isotope Effect ◽  
Comparison Study ◽  
Mos Transistors ◽  
Deuterium Isotope Effect ◽  
Hot Carrier ◽  
Hot Carrier Degradation

New hot-carrier degradation mode and lifetime prediction method in quarter-micrometer PMOSFET

1992 ◽  
Vol 39 (2) ◽  
pp. 404-408 ◽  
Author(s):  
T. Tsuchiya ◽  
Y. Okazaki ◽  
M. Miyake ◽  
T. Kobayashi
Keyword(s):  
Prediction Method ◽  
Lifetime Prediction ◽  
Hot Carrier ◽  
Hot Carrier Degradation
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