Built-in self-test design of current-mode algorithmic analog-to-digital converters

IEEE Transactions on Instrumentation and Measurement ◽

10.1109/19.585427 ◽

1997 ◽

Vol 46 (3) ◽

pp. 667-671 ◽

Author(s):

Chin-Long Wey

Keyword(s):

Current Mode ◽

Analog To Digital Converters ◽

Test Design ◽

Analog To Digital ◽

Self Test ◽

Built In Self Test

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A New Architecture of Built-In Self-Test for Analog-to-Digital Converters

2005 IEEE Instrumentationand Measurement Technology Conference Proceedings ◽

10.1109/imtc.2005.1604096 ◽

2005 ◽

Author(s):

Jason Wibbenmeyer ◽

Chien-In Henry Chen

Keyword(s):

Analog To Digital Converters ◽

Analog To Digital ◽

Self Test ◽

Built In Self Test

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High-Level Optimization of Built-In Self Test for Analog to Digital Converters

MELECON 2006 - 2006 IEEE Mediterranean Electrotechnical Conference ◽

10.1109/melcon.2006.1653046 ◽

2006 ◽

Author(s):

D. De Venuto ◽

L. Reyneri

Keyword(s):

Analog To Digital Converters ◽

Analog To Digital ◽

Self Test ◽

Built In Self Test ◽

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Built-in self test of high speed analog-to-digital converters

IEEE Instrumentation & Measurement Magazine ◽

10.1109/mim.2019.8917897 ◽

2019 ◽

Vol 22 (6) ◽

pp. 4-10 ◽

Author(s):

Edinei Santin ◽

Luis B. Oliveira ◽

Joao Goes

Keyword(s):

Analog To Digital Converters ◽

Analog To Digital ◽

Self Test ◽

Built In Self Test

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Built-In Self-Test for Low-Voltage High-Speed Analog-to-Digital Converters

IEEE Transactions on Instrumentation and Measurement ◽

10.1109/tim.2007.908343 ◽

2007 ◽

Vol 56 (6) ◽

pp. 2748-2756 ◽

Author(s):

Jason Wibbenmeyer ◽

Chien-In Henry Chen

Keyword(s):

Low Voltage ◽

Analog To Digital Converters ◽

Analog To Digital ◽

Self Test ◽

Built In Self Test

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A Time Domain Built-In Self-Test Methodology for SNDR and ENOB Tests of Analog-to-Digital Converters

13th Asian Test Symposium ◽

10.1109/ats.2004.18 ◽

2005 ◽

Author(s):

Hsin-Wen Ting ◽

Bin-Da Liu ◽

Soon-Jyh Chang

Keyword(s):

Time Domain ◽

Analog To Digital Converters ◽

Analog To Digital ◽

Test Methodology ◽

Self Test ◽

Built In Self Test

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A blind identification approach to digital calibration of analog-to-digital converters for built-in-self-test

2002 IEEE International Symposium on Circuits and Systems. Proceedings (Cat. No.02CH37353) ◽

10.1109/iscas.2002.1011471 ◽

2003 ◽

Author(s):

Le Jin ◽

K.L. Parthasarathy ◽

Degang Chen ◽

R. Geiger

Keyword(s):

Analog To Digital Converters ◽

Digital Calibration ◽

Blind Identification ◽

Analog To Digital ◽

Identification Approach ◽

Self Test ◽

Built In Self Test

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A New Built-in Self-test Approach For Digital-to-analog And Analog-to-digital Converters

IEEE/ACM International Conference on Computer-Aided Design ◽

10.1109/iccad.1994.629860 ◽

2005 ◽

Author(s):

K. Arabi ◽

B. Kaminska ◽

J. Rzeszut

Keyword(s):

Analog To Digital Converters ◽

Analog To Digital ◽

Self Test ◽

Built In Self Test ◽

Digital To Analog

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Built-in self-test for analog-to-digital converters in SoC applications

31st Annual Conference of IEEE Industrial Electronics Society, 2005. IECON 2005. ◽

10.1109/iecon.2005.1569250 ◽

2005 ◽

Author(s):

J. Wibbenmeyer ◽

C.-I.H. Chen

Keyword(s):

Analog To Digital Converters ◽

Analog To Digital ◽

Self Test ◽

Built In Self Test

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An embedded built-in-self-test approach for analog-to-digital converters

Proceedings of the 11th Asian Test Symposium, 2002. (ATS '02). ◽

10.1109/ats.2002.1181722 ◽

2003 ◽

Author(s):

Sheng-Hung Hsieh ◽

Ming-Jun Hsiao ◽

Tsin-Yuan Chang

Keyword(s):

Analog To Digital Converters ◽

Analog To Digital ◽

Self Test ◽

Built In Self Test

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An improved pattern generation for Built-in Self-test design based on boundary-scan reseeding

2009 International Conference on Communications, Circuits and Systems ◽

10.1109/icccas.2009.5250336 ◽

2009 ◽

Author(s):

Enmin Tan ◽

Wenwu Qian ◽

Yan Li

Keyword(s):

Pattern Generation ◽

Test Design ◽

Boundary Scan ◽

Self Test ◽

Built In Self Test

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