Cosmic-ray soft error rate characterization of a standard 0.6-/spl mu/m CMOS process
2000 ◽
Vol 35
(10)
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pp. 1422-1429
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1983 ◽
Vol 4
(6)
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pp. 172-174
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Keyword(s):
2012 ◽
Vol 59
(4)
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pp. 1078-1085
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Keyword(s):
2017 ◽
Vol 64
(1)
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pp. 622-629
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Keyword(s):
2012 ◽
Vol 59
(6)
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pp. 2914-2919
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1997 ◽
Vol 37
(4)
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pp. 691
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