Cosmic ray induced soft error rate in VLSI circuits

1983 ◽  
Vol 4 (6) ◽  
pp. 172-174 ◽  
Author(s):  
G.A. Sai-Halasz
2014 ◽  
Vol 23 (06) ◽  
pp. 1450091 ◽  
Author(s):  
RAMIN RAJAEI ◽  
MAHMOUD TABANDEH ◽  
MAHDI FAZELI

Fast and accurate estimation of soft error rate in VLSI circuits is an essential step in a soft error tolerant ASIC design. In order to have a cost effective protection against radiation effects in combinational logics, an accurate and fast method for identification of most susceptive gates and paths is needed. In this paper, an efficient, fast and accurate method for soft error propagation probability (SEPP) estimation is presented and its performance is evaluated. This method takes into account all three masking factors in multi cycles. It also considers multiple event transients as a new challenge in soft error tolerant VLSI circuit design. Compared with Monte Carlo (MC) simulation-based fault injection method, our SEPP estimation method has a high level of accuracy (with less than 2% difference) while offering 1000× speedup as compared with MC-based simulation.


1982 ◽  
Vol 29 (4) ◽  
pp. 725-731 ◽  
Author(s):  
G.A. Sai-Halasz ◽  
M.R. Wordeman ◽  
R.H. Dennard

2012 ◽  
Vol 59 (4) ◽  
pp. 1078-1085 ◽  
Author(s):  
Marco Silvestri ◽  
Emanuele Tracino ◽  
Roberto Destefanis ◽  
Cesare Lobascio ◽  
Giovanni Santin ◽  
...  

1982 ◽  
Vol 17 (2) ◽  
pp. 355-361 ◽  
Author(s):  
G.A. Sai-Halasz ◽  
M.R. Wordeman ◽  
R.H. Dennard

2000 ◽  
Vol 35 (10) ◽  
pp. 1422-1429 ◽  
Author(s):  
P. Hazucha ◽  
C. Svensson ◽  
S.A. Wender

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