Sequential test generation and synthesis for testability at the register-transfer and logic levels

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/43.277606 ◽

1993 ◽

Vol 12 (5) ◽

pp. 579-598 ◽

Author(s):

A. Ghosh ◽

S. Devadas ◽

A.R. Newton

Keyword(s):

Test Generation ◽

Sequential Test ◽

Synthesis For Testability ◽

Register Transfer

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Sequential test generation at the register-transfer and logic levels

27th ACM/IEEE Design Automation Conference ◽

10.1145/123186.123408 ◽

1990 ◽

Author(s):

Abhijit Ghosh ◽

Srinivas Devadas ◽

A. Richard Newton

Keyword(s):

Test Generation ◽

Sequential Test ◽

Register Transfer

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Test generation for digital circuits described by means of register transfer languages

IEE Proceedings E Computers and Digital Techniques ◽

10.1049/ip-e.1987.0012 ◽

1987 ◽

Vol 134 (2) ◽

pp. 69 ◽

Author(s):

E. Villar ◽

S. Bracho

Keyword(s):

Test Generation ◽

Digital Circuits ◽

Register Transfer

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Recent advances in sequential test generation

Digest of Papers. 1992 IEEE VLSI Test Symposium ◽

10.1109/vtest.1992.232759 ◽

2003 ◽

Author(s):

Kwang-Ting Cheng

Keyword(s):

Test Generation ◽

Sequential Test ◽

Recent Advances

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Robust delay-fault test generation and synthesis for testability under a standard scan design methodology

Proceedings of the 28th conference on ACM/IEEE design automation conference - DAC '91 ◽

10.1145/127601.127632 ◽

1991 ◽

Author(s):

Kwang-Ting Cheng ◽

Srinivas Devadas ◽

Kurt Keutzer

Keyword(s):

Test Generation ◽

Design Methodology ◽

Scan Design ◽

Synthesis For Testability ◽

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The BACK algorithm for sequential test generation

Proceedings 1988 IEEE International Conference on Computer Design: VLSI ◽

10.1109/iccd.1988.25661 ◽

2003 ◽

Author(s):

W.-T. Cheng

Keyword(s):

Test Generation ◽

Sequential Test

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Subsets of Primary Input Vectors in Sequential Test Generation for Single Stuck-at Faults

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2011.2157158 ◽

2011 ◽

Vol 30 (10) ◽

pp. 1579-1583 ◽

Author(s):

Irith Pomeranz

Keyword(s):

Test Generation ◽

Sequential Test ◽

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TOV: Sequential Test Generation by Ordering of Test Vectors

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2010.2041985 ◽

2010 ◽

Vol 29 (3) ◽

pp. 454-465 ◽

Author(s):

Irith Pomeranz ◽

Sudhakar M. Reddy

Keyword(s):

Test Generation ◽

Sequential Test ◽

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Sequential test generation with advanced illegal state search

Proceedings International Test Conference 1997 ◽

10.1109/test.1997.639686 ◽

2002 ◽

Author(s):

M.H. Konijnenburg ◽

J.Th. van der Linden ◽

A.J. van de Goor

Keyword(s):

Test Generation ◽

Sequential Test

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Acceleration of Test Generation for Sequential Circuits Using Knowledge Obtained from Synthesis for Testability

IEICE Transactions on Information and Systems ◽

10.1093/ietisy/e90-1.1.296 ◽

2007 ◽

Vol E90-D (1) ◽

pp. 296-305

Author(s):

M. NAKAZATO ◽

S. OHTAKE ◽

K. K. SALUJA ◽

H. FUJIWARA

Keyword(s):

Test Generation ◽

Sequential Circuits ◽

Synthesis For Testability

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Sequential test generation based on real-valued logic simulation

Proceedings International Test Conference 1992 ◽

10.1109/test.1992.527802 ◽

1992 ◽

Author(s):

K. Hatayama ◽

K. Hikone ◽

M. Ikeda ◽

T. Hayashi

Keyword(s):

Test Generation ◽

Sequential Test ◽

Logic Simulation

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