An integrated-optic device using electrooptic polymer waveguide on Si substrate for modulating focus spot intensity distribution

1993 ◽  
Vol 5 (11) ◽  
pp. 1291-1293 ◽  
Author(s):  
S. Ura ◽  
T. Kimura ◽  
T. Suhara ◽  
H. Nishihara
Keyword(s):  
Intensity Distribution ◽  
Spot Intensity ◽  
Si Substrate ◽  
Polymer Waveguide ◽  
Focus Spot ◽  
Electrooptic Polymer

Integrated-optic focal-spot intensity modulator using electrooptic polymer waveguide

1994 ◽  
Vol 12 (9) ◽  
pp. 1569-1576 ◽  
Author(s):  
M. Oh ◽  
S. Ura ◽  
T. Suhara ◽  
H. Nishihara
Keyword(s):  
Focal Spot ◽  
Spot Intensity ◽  
Polymer Waveguide ◽  
Intensity Modulator ◽  
Electrooptic Polymer

Modelling of the focal spot intensity distribution and the off-focal spot radiation in kilovoltage x-ray tubes for imaging

2020 ◽  
Vol 65 (2) ◽  
pp. 025002
Author(s):  
Brent van der Heyden ◽  
Gabriel Paiva Fonseca ◽  
Mark Podesta ◽  
Ivan Messner ◽  
Niklas Reisz ◽  
...  
Keyword(s):  
Intensity Distribution ◽  
Focal Spot ◽  
Spot Intensity ◽  
X Ray

Fourier crystal diffractometry based on refractive optics

2013 ◽  
Vol 46 (5) ◽  
pp. 1475-1480 ◽  
Author(s):  
Petr Ershov ◽  
Sergey Kuznetsov ◽  
Irina Snigireva ◽  
Vyacheslav Yunkin ◽  
Alexander Goikhman ◽  
...  
Keyword(s):  
Fourier Transform ◽  
High Resolution ◽  
Intensity Distribution ◽  
Focal Plane ◽  
Bragg Reflection ◽  
Si Substrate ◽  
X Ray ◽  
Spatial Intensity Distribution ◽  
Reflection Geometry ◽  
The Fourier Transform

X-ray refractive lenses are proposed as a Fourier transformer for high-resolution X-ray crystal diffraction. By employing refractive lenses the wave transmitted through the object converts into a spatial intensity distribution at its back focal plane according to the Fourier-transform relations. A theoretical consideration of the Fourier-transform technique is presented. Two types of samples were studied in Bragg reflection geometry: a grating made of strips of a thin SiO2film on an Si substrate and a grating made by profiling an Si crystal. Fourier patterns recorded at different angles along the rocking curves of the Si 111 Bragg reflection were analysed.

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